Omron Corporation

Ryo Ikeuchi

Takahiro Nakamura

Tadahiko Ogawa

Takaaki Yamada

Koji Takatori

Tatsuaki Kozono

Hidekatsu Nogami

Takahiro Sato

Akira Takaishi

Takema Sato

Tomohiro Yamada

Hironori Ogawa

Yasutaka Fujimaru

Peng-Cheng Zhao

A temperature abnormality detection device includes a plurality of infrared temperature sensors respectively capable of detecting temperature in a different detection area of an equipment, and a device body including a temperature abnormality determination unit that determines that the temperature in the detection area detected by each of the plurality of infrared temperature sensors is abnormal when the temperature in the detection area is higher than a reference temperature. The plurality of infrared temperature sensors is connected to each other by crossover wiring.

Temperature abnormality detection device

The temperature threshold determining device includes a temperature data storage unit, a representative temperature value determining unit, and a temperature threshold determining unit. The temperature data storage unit stores temperature data that indicates the temperature of a target apparatus during past operation. The representative temperature value determining unit determines a representative temperature value of the target apparatus during the past operation, which is derived using the temperature data stored in the temperature data storage unit. The temperature threshold determining unit determines at least one temperature threshold by using the representative temperature value during the past operation and a reference temperature value that is preset and configured to prevent the temperature abnormality.

Temperature threshold determining device, temperature abnormality determining system, temperature threshold determining method

A temperature abnormality detection system of the present invention includes a first temperature sensor that measures a first temperature indicated by a target device and a second temperature sensor that measures a second temperature indicated by ambient air around the target device. A temperature difference between the first temperature and the second temperature is calculated, and when this temperature difference becomes a predetermined threshold value or more, it is determined that a temperature abnormality of the target device has occurred.

Temperature abnormality detection system, temperature abnormality detection method, and computer-readable recording medium

Sensor bracket

An RFID data management device includes an RFID data acquisition unit acquiring RFID management data including identification information of an RFID, a relevant data acquisition unit acquiring RFID relevant data including a use start date of the RFID, and a remaining time calculation unit calculating a remaining data guarantee time of the RFID using a data guarantee period dependent on the identification information and the environmental temperature of the RFID, and the environmental temperature. The remaining time calculation unit calculates the remaining time using an environmental temperature in a first period from a manufacturing date of the RFID to a use start timing, a data guarantee period according to the environmental temperature in the first period, an environmental temperature in a second period from the use start timing to a timing of confirmation, and a data guarantee period according to the environmental temperature in the second period.

Device, method, and program managing RFID data based on environmental temperature

Growing community of inventors

Kusatsu, Japan

Ryo Ikeuchi