Analog Devices,inc.

Analog Devices International Unlimited Company

Ryan Schnell

Kenneth G Richardson

Eric Benedict

Deepak Gunasekaran

Maurice Moroney

Systems and methods for early-onset electrical fault detection are described in which a rate-of-rise of channel current in a device such as a transistor is sensed, indicating whether an electrical fault is present. In some embodiments, the rate-of-rise of the channel current may be sensed by detecting whether a current flowing away from a control terminal of the device is greater than a threshold level. In the event that an electrical fault is detected, the device may be shut off to prevent damage to the device.

Short-circuit protection of power semiconductor device by sensing current injection from drain to gate

An embodiment of a power supply circuit to generate a supply voltage for a gate driver circuit can include an isolated power supply circuit to receive a first voltage in a first isolated system and provide power to a cyclic charging power supply circuit, the cyclic charging power supply circuit providing a supply voltage to the gate driver circuit in a second isolated system, the isolated power supply circuit providing the power to the cyclic charging power supply circuit while the gate driver circuit drives a transistor in an on state. The isolated power supply circuit can include a control circuit to regulate the power provided to maintain or increase the supply voltage while the gate driver circuit drives the transistor in an on state. The power supply circuit can also include the cyclic charging power supply circuit to receive a second voltage in the second isolated system and provide the supply voltage to the gate driver circuit. The cyclic charging power supply circuit can include one or more of a bootstrap power supply circuit or a charge pump power supply circuit.

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Longmont, CO, United States of America

Ryan Schnell