International Business Machines Corporation

Ryan Patrick King

Gary A Van Huben

Stephen P Glancy

Kevin M Mcilvain

John Stanley Bialas, Jr

Aspects include configuring a plurality of functional self-test controllers in a test control device to run a plurality of functional test cases in parallel on a plurality of devices under test. Test traffic is arbitrated between the functional self-test controllers and a plurality of packeted protocol layer interfaces of the test control device. One or more protocol specific conversions are performed between the test traffic and a device-specific packeted protocol of each of the devices under test. Payload checking is performed between the packeted protocol layer interfaces and the devices under test to verify responses of the devices under test to the functional test cases.

Packeted protocol device test system

A double data rate (DDR) memory controller writes a test pattern to a location in a DDR memory for a coarse calibration test, delayed by a first number of cycles set in a tunable write delay setting. The DDR memory controller simulates a single data rate (SDR) mode for the coarse calibration test by only comparing every other read beat of the test pattern read from the DDR memory, delayed by a second number of cycles set in tunable read delay setting, wherein every other read beat is latched for a full cycle. The DDR memory controller, responsive to every other read beat of the test pattern matching an expected result, sets the first number of cycles and the second number of cycles as coarse calibration settings for a DRAM.

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Lagrangeville, NY, United States of America

Ryan Patrick King