Texas Instruments Corporation

Ryan Michael Brown

Anand Ganesh Dabak

Baher S Haroun

Srinath Mathur Ramaswamy

Charles Kasimer Sestok, Iv

Alan Henry Leek

Domingo G Garcia

A microcontroller-based system for measuring the impedance of a device under test (DUT), responsive to a square wave stimulus, includes parallel stimulus signal paths, selectable by a switch, that can correspond to different stimulus frequency ranges. At least one of the paths includes an off-chip PLL and integer divider circuit to modify the frequency of the stimulus. A discrete Fourier transform executed by a processor is used to determine the impedance of the DUT at the stimulus frequency. Multiple frequencies can be analyzed at the same time by using a summation circuit and/or by analyzing odd harmonics of the stimulus frequency.

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Allen, TX, United States of America

Ryan Michael Brown