Promet International, Inc.

Ryan Elliot Eckman

Peter David Koudelka

Lubomir Koudelka

Steven M Arnold

Eric Karl Lindmark

An inspection system includes optical components for operating the inspection system in an interference fringe imaging mode and a microscope imaging mode. The inspection system further includes at least one optical light source configured to emit a first wavelength of light to operate the inspection system in the interference fringe imaging mode and configure to emit a second wavelength of light to operate the inspection system in the microscope mode. The first wavelength of light is different from the second wavelength of light.

Multifunction solid-state inspection system

An optical probe has optical components of an interferometer and includes an optical axis, at least one optical source for emitting light along an illumination path that is at least partially coaxial with the optical axis, a first beam splitter and a first lens. The first beam splitter intersects the optical axis and splits the light from the at least one optical source into a first beam for traveling along a reference path that is coaxial with the optical axis to a reference surface and a second beam for traveling along a test path that is coaxial with the optical axis to a specimen. The first lens is interposed along the reference path.

Coaxial interferometer and inspection probe

The present invention provides an inspection system for inspecting a surface of an optical specimen. The inspection system includes an optical testing device having a main body and an optical axis. The optical testing device includes an optical imaging system housed in the main body. The optical imaging system includes imaging components for acquiring a microscope visual image and for acquiring at least one interference fringe image of the surface of the optical specimen. The optical testing device also includes a translational mechanism housed in the main body and configured to allow linear movement of the optical imaging system and to prevent off-axis movement of the optical imaging system.

Growing community of inventors

Columbus Township, MN, United States of America

Ryan Elliot Eckman