Boe Technology Group Co., Ltd.

Hefei Boe Optoelectronics Technology Co., Ltd.

Ruwang Guo

Jie Wang

Yanzhao Li

Jingang Fang

Wulin Shen

Haifeng Chen

Dingyuan Li

An aperture measuring device and aperture measuring method for measuring the size of the aperture of a through-hole in a conductive structure is described to reduce the aperture measurement time and improve the working efficiency. The aperture measuring device includes: an aperture testing component for being inserted into the through-hole, wherein the aperture measuring device includes a plurality of resistor segments with different diameters, the individual resistor segments being successively connected in series in an order of the sizes of their diameters; and a measuring module for measuring the resistance value of a resistor segment unable to be inserted into the through-hole in the aperture testing component to determine the size of the aperture of the through-hole.

Aperture measuring device and an aperture measuring method

A display substrate is provided, the display substrate comprising at least one pixel unit, the pixel unit including a pixel driving circuit (A) located in an active driving circuit backplane, and a light-emitting diode chip (A) disposed on the active driving circuit backplane; the light-emitting diode chip (A) being electrically connected with the pixel driving circuit (A). And a manufacturing method of the display substrate, and a display device comprising the display substrate are further provided.

Display substrate and manufacturing method thereof, and display device

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Beijing, China

Ruwang Guo