Emscan Corporation

Apple Inc.

Ether Capital Corporation

Ruska Patton

Jason Jin

Adiseshu Nyshadham

Jr-Yi Shen

Patrick Antoine Rada

Jia-Woei Chen

Gil Montag

Kasra Payandehjoo

Robert Xue

Sammer Al-Robaee

Yiping Zhou

A testing apparatus for electromagnetically sensitive equipment includes a housing defining a testing chamber. The housing blocks transmission of electromagnetic waves from an external environment into the testing chamber and reduces reflection of electromagnetic waves within the testing chamber. The testing apparatus also includes a tube defining an air flow path between the testing chamber and the external environment. The tube blocks transmission of electromagnetic waves from the external environment into the air flow path. The tube includes a proximal end coupled to an opening in the housing such that the air flow path is fluidly coupled to the testing chamber via the opening, a distal end opposing the proximal end, and a bent segment extending between the proximal end and the distal end.

Electromagnetic shielded testing chamber with ventilation

A method of calibrating or correcting near field or far field data from a scanner board array of integrated measuring probes that are electronically switched to capture near-field data from an antenna-under-test (AUT) and having a board output includes the steps of coupling a calibrating probe with one of the measuring probes, measuring the power through the measuring probe and the calibrating probe and isolating the effect of the RF path from the measuring probe to the board output by removing the effect of the calibrating probe, and repeating for each measuring probe. Also disclosed are methods for correcting for scattering effects and loading effects on the AUT.

Reactive near-field antenna measurement

A scanner system and method operable for high-resolution spatial scanning of an electromagnetic field radiated by an electronic device under test (DUT) are provided. The electromagnetic field level radiated by the DUT is measured with a probe array comprising a plurality of spatially separated switched probes, an analyzer, and a computer. An actuator changes the relative position of the probe array to the DUT by a distance less than or equal to the separation distance between the probes, and the electromagnetic field level is measured and stored again.

Scanner system and method for high-resolution spatial scanning of an electromagnetic field radiated by an electronic device under test

A test station for wireless devices and methods for calibration thereof. The test station includes a signal generator, a calibrator, a scanner having receiving and transmitting antennas, a signal analyzer, and a computer. Under the direction of the computer, the signal generator generates a calibration signal in accordance with a programmable calibration signal script. The calibrator may be used to emulate either a wireless device in transmit mode by transmitting the calibration signal to the scanner for analysis by the signal analyzer, or a wireless device in receive mode by receiving the calibration signal from the scanner for analysis by the signal analyzer. The behavior of the test station is calibrated by correlating signal parameters of the calibration signal as specified by the calibration signal script and as measured at the signal analyzer.

Test station for wireless devices and methods for calibration thereof

A near field microwave scanning system includes a switched array of antenna elements forming an array surface, a scan surface substantially parallel to the array surface and separated by a distance less than about 1 wavelength of the measured frequency, and a processing engine for obtaining and processing near field data, without the use of an absorber.

Growing community of inventors

Calgary, Canada

Ruska Patton