Xilinx, Inc.

Rupendra Bakoliya

Saikat Bandyopadhyay

Ender Tunc Eroglu

Rajvinder S Klair

Dhiraj Kumar Prasad

Jayashree Rangarajan

A method includes instantiating a simulation of an electronic design for a device under test (DUT) in hardware design language responsive to a user selection thereof. A subset of leaf nodes from a plurality of leaf nodes from the electronic design with input/output signaling of more than two values is identified. A hierarchical path for each leaf node of the plurality of leaf nodes of the electronic design for the DUT with respect to a testbench is calculated. A bypass module for the subset of leaf nodes is generated. The bypass module is generated in response to detecting presence of the subset of leaf nodes in the electronic design with input/output signaling of more than two values. The bypass module facilitates communication between the testbench and the subset of leaf nodes. Leaf nodes other than the subset of leaf nodes communicate with the testbench without communicating through the bypass module.

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Hyderabad Telangana, India

Rupendra Bakoliya