Changxin Memory Technologies, Inc.

Anhui University

Rumin Ji

Zhan Ying

Jun He

Xin Li

Junning Chen

Chunyu Peng

Wenjuan Lu

Xiulong Wu

Zhiting Lin

Yangkuo Zhao

Haining Xu

An anti-fuse address decoding circuit includes: a pre-decoding circuit, configured to decode a programming address of an anti-fuse memory array and output a programming address pre-decoded signal; a level shift circuit, coupled to the pre-decoding circuit, and configured to boost the programming address pre-decoded signal and output a boosted signal; and a programming address decoding circuit, configured to receive the boosted signal, decode the boosted signal and output a programming address signal.

Anti-fuse address decoding circuit, operation method, and memory

A programmable memory includes a plurality of antifuse cells, a plurality of word lines and a control circuit. The plurality of antifuse cells are arrayed along row and column directions, herein each of the plurality of antifuse cells includes an antifuse and a switching transistor, a first end of the antifuse being connected to a first terminal of the switching transistor. Each of the plurality of word lines is connected to gates of the switching transistors located in a same row. The control circuit is connected to the plurality of word lines, and is configured to provide a first voltage to a word line connected to a target antifuse cell in a program mode, and provide a second voltage to the word line connected to the target antifuse cell in a read mode, herein the first voltage is greater than the second voltage.

Programmable memory and method for driving programmable memory

Embodiments provide an anti-fuse storage layout and a circuit thereof, and an anti-fuse memory and a design method thereof. The anti-fuse storage layout includes: active regions extending along a first direction and being discretely arranged along a second direction, each of the active regions including at least two memory cell regions arranged along the first direction, each of the at least two memory cell regions including an anti-fuse region and a control region arranged along the first direction, and the control regions of the adjacent memory cell regions being adjacent to each other along the first direction; a word line region extending along the second direction and intersecting with the control region; an electrical connection region extending along the second direction and intersecting with the anti-fuse region; and a programming control region extending along a third direction and being positioned at one side of the corresponding active region.

Anti-fuse storage layout and circuit thereof, and anti-fuse memory and design method thereof

An anti-fuse readout circuit, an anti-fuse memory, and a testing method are provided. The anti-fuse readout circuit includes: a latch circuit configured to latch data read out from an anti-fuse storage array; and a transmission circuit connected to an output terminal of the latch circuit, the transmission circuit being configured to transmit data latched in the latch circuit to a data port in response to a read test command.

Anti-fuse readout circuit, anti-fuse memory, and testing method

Embodiments of the present disclosure relate to the field of semiconductor technology, and provide an anti-fuse memory and a control method thereof. The anti-fuse memory is configured to generate a programming pulse signal based on a row strobe signal, a word line of the anti-fuse memory array is configured to receive the row strobe signal, and the anti-fuse memory array is programmed in response to the programming pulse signal. The embodiments of the present disclosure are at least advantageous to improving accuracy of reading data from the anti-fuse memory array and improving yield of the anti-fuse memory.

Anti-fuse memory and control method thereof

The present disclosure provides a sense amplifier, a memory, and a method for controlling a sense amplifier, relating to the technical field of semiconductor memories. The sense amplifier comprises: an amplification module; and an offset voltage storage unit electrically connected to the amplification module; wherein, in an offset cancellation stage of the sense amplifier, the sense amplifier is configured to comprise a current mirror structure to store an offset voltage of the amplification module in an offset voltage storage unit. The present disclosure can realize the offset cancellation of the sense amplifier.

Sense amplifier, memory and method for controlling sense amplifier

A power supply circuit and a memory are provided. The power supply circuit includes a voltage source, multiple power supply circuits and a control circuit. The multiple power supply circuits are connected to the voltage source. If the voltage source is effective and the multiple power supply circuits are in an enable state, a voltage of a power supply terminal is pulled up to a preset voltage, and power is supplied to the load units during the pulling up process. A first-type power circuit enters the enable state if a first enable signal is received, and each of second-type power supply circuits enters the enable state if second enable signal is received.

Power supply circuit and memory

A state detection circuit of an anti-fuse memory cell includes a first switching element, having a first end connected to a power supply, a second end connected to a first node, and a control end connected to a controller; an anti-fuse memory cell array including a plurality of anti-fuse memory cell sub-arrays, bit lines of the plurality of anti-fuse memory cell sub-arrays being all connected to the first node, and word lines of the plurality of anti-fuse memory cell sub-arrays being all connected to the controller; and a comparator, having a first input end connected to the first node, and a second input end connected to a reference voltage.

Anti-fuse memory cell state detection circuit and memory

A state detection circuit for an anti-fuse memory cell includes: amplifier, having first input terminal connected with first reference voltage, second input terminal connected with first node and output terminal connected with second node; anti-fuse memory cell array, including anti-fuse memory cell sub-arrays, bit lines of sub-arrays are connected with first node, word lines of sub-arrays are connected with controller and each sub-array includes anti-fuse memory cells; first switch element, having first terminal connected with power supply, second terminal connected with first node and control terminal connected with second node; second switch element, having first terminal connected with power supply, second terminal connected with third node and control terminal connected with second node; third switch element, having first terminal connected with third node, grounded second terminal and control terminal connected with controller; and comparator, having first and second input terminals connected with third node and second reference voltage respectively.

State detection circuit for anti-fuse memory cell, and memory

Provided is an anti-fuse memory circuit. The anti-fuse memory circuit includes a memory array, a bit line (BL), and a word line (WL); an anti-fuse memory cell (FsBIn) electrically connected to the bit line (BL) through a first switch transistor (Add); a second switch transistor (Add) configured to connect the bit line (BL) to a transmission wire (); a third switch transistor (Add) configured to discharge the transmission wire (); a reading module () including a first input end (+) connected to the transmission wire (), a second input end (&#x2212;) for receiving a reference voltage (VTRIP), and a sampling input end (C) for receiving a sampling signal (CLK); and a compensation module (), connected to the third switch transistor (Add) and configured to slow down a drop speed of a voltage at the transmission wire ().

Anti-fuse memory circuit

A circuit for detecting an anti-fuse memory cell state includes a current providing module connected to a first node and used to provide constant current; an anti-fuse memory cell array connected to the first node and including at least one bit line, the at least one bit line is connected to a plurality of anti-fuse memory cells and the first node; and a comparator, a first input end of the comparator is connected to the first node and a second input end of the comparator is connected to a first reference voltage, and used to detect a storage state of an anti-fuse memory cell to be tested in the anti-fuse memory cell array.

Circuit for detecting anti-fuse memory cell state and memory

A circuit for detecting a state of an anti-fuse storage unit includes a first current module, a second current module, and a comparator. The first current module has a first end connected to an anti-fuse storage unit array through a first node and a second end connected to a second node. The first current module is configured to output a detection current through the second node. The second current module has a first end connected to a first end of a reference resistor through a third node and a second end connected to a fourth node. A second end of the reference resistor is grounded. The second current module is configured to output a reference current through the fourth node. The comparator has a first input end connected to the second node and a second input end connected to the fourth node.

Circuit for detecting state of anti-fuse storage unit and memory device thereof

The disclosure provides a sense amplifier and a control method thereof. The sense amplifier includes: a pre-charge module, a first input and output terminal, a second input and output terminal, a first PMOS transistor, a second PMOS transistor, a first NMOS transistor, and a second NMOS transistor, a first switch unit, a second switch unit, a third switch unit, a fourth switch unit, a fifth switch unit, a sixth switch unit, a seventh switch unit, an eighth switch unit, a first energy storage unit and a second energy storage unit. The sense amplifier can compensate for the offset voltage. The result is a sense amplifier with greatly reduced offset voltage, thereby improving the sensitivity and resolution of the sense amplifier.

Sensitivity amplifier

A voltage detection circuit and a charge pump circuit using the voltage detection circuit are provided. The voltage detection circuit includes: a voltage raising circuit configured to adjust a voltage to be measured and then output an adjusted voltage, where the adjusted voltage is equal to the sum of the voltage to be measured and a reference voltage; and the reference voltage is generated by a combination of a first voltage with a positive temperature coefficient and a second voltage with a negative temperature coefficient.

Voltage detection circuit and charge pump circuit

An anti-fuse memory circuit includes: a memory array including multiple anti-fuse memory cells; bit lines, each connected to the anti-fuse memory cells arranged in extension direction of the bit line, each anti-fuse memory cell being electrically connected to respective one of bit lines through first switch transistor; word lines, each connected to first switch transistors arranged in extension direction of word line; a second switch transistor connects one of the bit lines to transmission wire; a reading circuit, having first input terminal connected to the transmission wire, second input terminal for receiving reference voltage, and sampling input terminal for receiving sampling signal; and a signal generation circuit for generating sampling signal according to precharge voltage and precharge signal, where precharge signal is used for instructing to precharge transmission wire to precharge voltage, and delay duration between sampling signal and precharge signal is positively correlated with voltage amplitude of precharge voltage.

Growing community of inventors

Hefei, China

Rumin Ji