Infineon Technologies Ag

Rudolph Walter

Thomas Von Der Ropp

Wolfgang Nikutta

Gunther Kuchinke

Hartmut Schmokel

An apparatus for function testing of electronic circuits includes a tester array having a terminal. A test circuit has at least two resistor elements, a common circuit node connected to the resistor elements for connection to the terminal of the tester array, and terminals of the resistor elements each being remote from the circuit node for connection to a respective output of an electronic circuit to be tested. A testing method for function testing of electronic circuits with such an apparatus includes placing the electronic circuit into a state in which signals are present at an output of the electronic circuit to be tested. The electronic circuit is function tested with respect to a resultant signal being established at the common circuit node.

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Shelburne, VT, United States of America

Rudolph Walter