Finisar Corporation

H2optx Inc.

Redox Biomedical, Inc.

C8 Medisensors Inc.

Rudolf J Hofmeister

Paul Kessler Rosenberg

Lewis B Aronson

Donald Arthur Ice

Jan Lipson

James Edward Stewart

Giorgio Giaretta

Darin James Douma

Samantha R Bench

Lucy G Hosking

Andreas G Weber

Stefano Schiaffino

Scott W Tandy

Chris Togami

Stephen T Nelson

Greta Light

Ueyn L Block

Anthony Ho

Daniel K Case

The′ Linh Nguyen

The' Linh Nguyen

Jeffrey Bryant Price

Frank H Levinson

Gary D Sasser

Mina Farr

Qingfeng Huang

Robert P McNamara

Harold G Sampson

The'linh Nguyen

Stephen J Waydo

William R Freeman

Dev Kumar

Yuxin Zhou

Dmitri Bannikov

Sascha Hallstein

Konstantinos G Haritos

J Christopher Dries

Song Miao

John C Dirkson

Jeffrey M Bernhardt

Axel Mehnert

Greta L Light

Various systems and methods of analyzing one or more properties of a sample are provided. The system includes a self-contained purging device having a sample holder and one or more analyzers for analyzing one or more properties of the sample. The purging device is configured to remove sample contained within the sample holder when an analysis is complete. In one embodiment the purging device is configured via an air pump having a tube in fluid communication with an air inlet of the sample holder, wherein the air pump is configured to deliver pressurized air to the air inlet and thereby purge the sample. The pressurized air is localized ambient air, and substantially free of contaminants. Methods and other systems are also described and illustrated.

Analysis and purging of materials in manufacturing processes

In some aspects, a device for apportioning granular samples includes a sample feeder defining a conduit, the conduit including a first opening to receive the granular samples and a second opening. The device includes a shuttle operably coupled to the sample feeder to receive the granular samples from the conduit via the second opening. The shuttle is configured to apportion the granular samples to incrementally enter a sample chamber to be analyzed. The device includes an outlet conduit fluidly coupled to the sample chamber and configured to permit the sample chamber to be evacuated.

Devices and methods for analyzing granular samples

The present disclosure generally relates to systems, devices and methods for analyzing and processing samples or analytes. In one example configuration, a method of analyzing an analyte includes shaving a first layer of a plurality of layers of an analyte to expose a first surface of an analyte. The method includes positioning the first surface of the analyte over a window of a hyperspectral analyzation subassembly. The method further includes scanning the first surface of the analyte by the hyperspectral analyzation subassembly to obtain information regarding the analyte proximate the first surface. Other systems, devices and methods are disclosed herein.

Devices and methods for analyzing layers of samples

Various systems and methods of monitoring laser safety by sensing contact of the system with a sample are provided. The system includes a focusing element for focusing an incident light from a laser light source onto a sample, an optical element having a collection zone for collecting a signal from the sample, a reflected light sensor for sensing a reflected light from the sample, wherein the reflected light sensor is located outside the collection zone of the optical element and on an inner surface of a housing of the system, an electrical circuit operably connected to the reflected light sensor and the laser light source and configured to control power to the laser light source in accordance with the reflected light sensed by the reflected light sensor and a spectral analyzer for processing the signal. Methods and other systems are also described and illustrated.

Systems having a reflected light sensor and methods of use

An optical system is described where a portion of the Rayleigh light arriving from a sample is incident on the same image sensor as a Raman signal to be measured. As a result, the difference in wavelength between the measured Rayleigh line and the measured Raman peaks may be determined directly without the need for a separate sensor, optical path, or calibration.

Laser wavelength tracking via direct laser measurement and optical filters in a spectrometer

An apparatus consisting of stacked slab waveguides whose outputs are vertically staggered is disclosed. At the input to the stacked waveguides, the entrances to each slab lie in approximately the same vertical plane. A spot which is imaged onto the input will be transformed approximately to a set of staggered rectangles at the output, without substantial loss in brightness, which staggered rectangles can serve as a convenient input to a spectroscopic apparatus. A slit mask can be added to spatially filter the outputs so as to present the desired transverse width in the plane of the spectroscopic apparatus parallel to its dispersion.

Apparatus for transforming the aspect ratio of an optical input field based on stacked waveguides

An apparatus is presented for stabilizing an optical, thermal, and mechanical interface between a spectroscopic and/or imaging system and a biological sample. The apparatus includes a window retainer having a retainer surface and a well. The retainer surface surrounds the well. Further, the retainer surface is substantially planar. An optical window is located in the well. The optical window comprises a first and second surface. The second surface is in contact with the window retainer. The first surface is substantially flush with the retainer surface. The apparatus further includes an attachment mechanism coupling the window retainer to the biological sample such that a fluid, gel, adhesive or elastomer interposed between the optical window and the biological sample is trapped in the well.

Apparatus for stabilizing mechanical, thermal, and optical properties and for reducing the fluorescence of biological samples for optical evaluation

A translation circuit for mediating between a fiber-optic controller chip and a host device. The translation circuit may be on a fiber-optic transponder. The controller chip includes a phase locked loop that outputs a short synchronization signal when a hunting frequency passes through a target data signal frequency while hunting for a data signal and outputs a synchronization signal when the phase locked loop is locked onto a data signal. The translation circuit distinguishes between the synchronization signals and generates a lock signal when the phase locked loop is locked onto a data signal, but does not when the hunting frequency passes through the target data signal frequency. The lock signal may be used by a host device into which the fiber-optic transponder has been in installed. Errors from misinterpreted signals can thus be mitigated.

Circuit for converting a transponder controller chip output into an appropriate input signal for a host device

Automatic selection and setting an operational data rate of an optoelectronic device. In particular, an integrated circuit includes a data rate select input for the selection and setting of the operational data rate. The integrated circuit internally generates a loss of lock signal if an input data rate does not match the operational data rate. The integrated circuit then automatically sets and selects operational data rates within a predetermined range of operational data rates until the loss of lock signal is deasserted or until all of the rates within the predetermined range of operational data rates have been attempted.

Automatic selection of data rate for optoelectronic devices

Systems, devices and methods are disclosed for adjusting the operating characteristic of an optical signal transmitted by an optoelectronic device based on the operational data rate, as is indicated by a 'rate select' signal. The rate select can be generated automatically, or can be transmitted from a host device. One example of an operating characteristic that can be adjusted is the optical modulation level of the transmitted signal.

Apparatus, system and methods for modifying operating characteristics of optoelectronic devices

An integrated circuit. The integrated circuit is usable in a transceiver module. The integrated circuit includes an input port that is configured to receive a data stream. A clock port on the integrated circuit is configured to receive a reference clock diplexed with another signal or voltage used by the integrated circuit. An eye opening circuit is connected to the input port and clock. The eye opening circuit is configured to retime the data stream received at the input port. An output port is connected to the eye opening circuits The output port is configured to transmit a retimed signal from the eye opening circuit to a device external to the integrated circuit. A bypass circuit is connected to the input port and the output port. The bypass circuit may selectively bypass the eye opening circuit.

Transceiver module and integrated circuit with clock and data recovery clock diplexing

Optical transceivers have loopback and pass-through paths for diagnosing transceiver components and optical networks connected to the optical transceiver or for routing data out of the transceiver in a pass-through mode. The loopback paths are selectively configured so that a selected number of the components in the transceiver are included in the loopback path. Where more than one loopback path is present, a network administrator can select which components will be included in a particular test so that, depending on whether a signal is returned on the loopback path as intended, the network administrator can determine which components are operating correctly and which are faulty. The loopbacks can be configured to run on the electrical side of the transceiver from input port to output port or on the optical side from receiver to transmitter. The pass-through paths can be used to connect the transceiver to other devices.

Optical and electrical channel feedback in optical transceiver module

A general method is given for screening laser diodes for electrostatic discharge, (ESD), damage. The laser diode may be selectively isolated from the laser driver so that a current-voltage (I-V), curve can be taken and then compared to curves taken previously on the same laser diode to ascertain the possibility of ESD damage. Presumably the initial I-V curve will be representative of the characteristics of that particular laser in the undamaged state. Such an initial curve may be supplied by the manufacturer and may be a curve specific to a particular laser diode. Comparison with a standard curve is not sufficient to determine ESD damage in the early stages of failure. Some embodiments focus on isolating the laser diode from the laser driver, storing the information locally in the transceiver, and providing some analysis resulting in flagging laser diodes showing changes that are indicative of ESD damage.

Screening optical transceiver modules for electrostatic discharge damage

Systems, devices and methods are disclosed for automatically selecting and setting an operational data rate of an optoelectronic device. In particular, an integrated circuit includes a data rate select input for the selection and setting of the operational data rate. The integrated circuit internally generates a loss of lock signal if an input data rate does not match the operational data rate. The integrated circuit then automatically sets and selects operational data rates within a predetermined range of operational data rates until the loss of lock signal is deasserted or until all of the rates within the predetermined range of operational data rates have been attempted.

An electronic assembly tester for testing an electrical component of an optoelectronic device. The electrical component includes a transmit and receive port. The tester includes of a base, an arm, and a hinge. The arm includes a flex circuit and cables. The arm is rotated into a closed position to form a temporary electrical connection between the electrical component and the flex circuit. Other configurations for forming a temporary electrical connection between the test circuit and the electrical component are possible. The electrical component is evaluated by providing a data signal to the transmit portion of the electrical component and evaluating a return data signal obtained from the receive portion of the electrical component.

Electronic assembly tester and method for optoelectronic device

Growing community of inventors

Sunnyvale, CA, United States of America

Rudolf J Hofmeister