Adv Antest Corporation

Rudi Bauer

Martin Fischer

Franz Rottner

Alois Thalmaier

A power supply is configured to perform an at least partial compensation of a voltage variation caused by a load change using a voltage variation compensation mechanism which is triggered in response to an expected load change. An Automated test equipment for testing a device under test comprises a power supply, which is configured to supply the device under test. The automated test equipment comprises a pattern generator configured to provide one or more stimulus signals for the device under test. The power supply is configured to perform an at least partial compensation of a voltage variation caused by a load change using a voltage variation compensation mechanism which is activated in synchronism with one or more of the stimulus signals and/or in response to one or more response data signals from the device under test. Corresponding methods and a computer program are also described.

Power supply, automated test equipment, method for operating a power supply, method for operating an automated test equipment and computer program using a voltage variation

A power supply comprises an output stage configured to provide a supply current, in order to obtain a supply voltage. The power supply also comprises a digital regulator configured to receive a reference voltage information and a measured voltage information and to provide a control signal. The power supply further comprises an inner analog control loop, wherein the inner analog control loop is configured to provide an analog feedback signal, which is based on the supply voltage, to the output stage, to make an analog regulation contribution to a regulation of the supply voltage. A method for supplying power to a load is also disclosed.

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Böblingen, Germany

Rudi Bauer