Advanced Micro Devices Corporation

Royce K Presley

Hamilton B Carter

Joseph C Skrovan

A test methodology for a cache memory subsystem includes setting a test unit to initiate a snoop cycle on a local bus upon lapse of a predetermined delay. The predetermined delay is initially set to a very short delay or a zero delay. The snoop cycle to be executed may take the form of an inquire cycle to a predetermined memory address. The test unit is further set or programmed to begin monitoring the local bus for certain activity including activity which is indicative of whether the snoop cycle occurred. After programming the test unit, the processor core executes a memory operation associated with the address of the snoop cycle. This memory operation causes a cache line transition. At some point, either before, during or after effectuation of the memory operation, the snoop cycle is executed by the test unit in accordance with the predetermined delay. Upon completing the memory operation, a status register is read from the test unit to determine whether the snoop cycle has yet occurred. If the snoop cycle occurred prior to completing the memory operation, the predetermined delay is increased and the test is repeated for the increased delay. Prior to repeating the test, the cache line's coherency with external memory is checked for conformance with the cache protocol. Additionally, the test unit may further be programmed to detect an occurrence of certain external local bus signals generated by the cache memory subsystem, such as a signal indicating a hit to a cache line occurred, and a signal indicating that a hit to a modified line in the cache occurred. The test is repeated until it is determined that the snoop cycle has not occurred upon completion of the line fill instruction.

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Kyle, TX, United States of America

Royce K Presley