Cascade Microtech, Inc.

Roy Jensen

Kazuki Negishi

Michael E Simmons

Philip Wolf

Ryan Garrison

A chuck for testing an integrated circuit includes an upper conductive layer having a lower surface and an upper surface suitable to support a device under test. An upper insulating layer has an upper surface at least in partial face-to-face contact with the lower surface of the upper conductive layer, and a lower surface. A middle conductive layer has an upper surface at least in partial face-to-face contact with the lower surface of the upper insulating layer, and a lower surface.

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Lapine, OR, United States of America

Roy Jensen