Ati Technologies Inc.

Ronny Chan

Richard W Fung

Ramesh Senthinathan

Mikhail Rodionov

Paul Edelshteyn

Karen Wan

The present disclosure relates to apparatus and methods for measurement of analog voltages in an integrated circuit. In particular, the apparatus includes an on-chip digital-to-analog converter configured to receive a variable digital input code and output a corresponding analog voltage corresponding to the variable digital input code. The apparatus also includes an on-chip comparator circuit configured to receive the analog voltage output by the digital-to-analog converter and a test analog voltage as inputs and to provide an output indicating the test analog voltage. Further, the apparatus includes an on-chip logic operative to determine the test analog voltage based on the output of the comparator circuit. A corresponding method is also disclosed.

Apparatus and methods for measurement of analog voltages in an integrated circuit

A multiphase clock generating circuit includes a multiphase clock generator that produces a plurality of multiphase output signals at a first frequency and a multiphase divider with delayed reset control. The multiphase divider with delayed reset control is operatively coupled to receive the plurality of multiphase output signals at the first frequency and further operative to produce a plurality of multiphase output signals at a second frequency based on reset control information. As a result, an interface can be supplied with and switch between multiphase clock at different frequencies within a short amount of time with reduced power consumption and circuit area.

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North York, Canada

Ronny Chan