Weihai Hualing Opto-electronics Co., Ltd

Rongxin Song

Kai Zhang

Wuchang Qi

Li Jiang

Yonghui Lin

Xiaofeng Sun

Xiumei Qi

Mingfeng Sun

Tao Qu

Jie Xian

Pengtong Wang

Disclosed are a thickness detection device, method and system, a storage medium and a processor. The thickness detection device includes: a detection unit, including a plurality of thickness detection chips, wherein the thickness detection chips are sequentially arranged at least in a second direction; and a common unit, arranged opposite and spaced from the detection unit in a first direction, wherein distances between at least two positions of a first surface of the common unit and the detection unit are different, the second direction is perpendicular to the first direction and a moving direction of an object to be detected, and the first surface is a surface of the common unit which is close to the measurement unit.

Thickness detection device, method and system

Provided are a method and an apparatus for detecting a thickness of paper, and a storage medium. The method includes: acquiring a first thickness image of a target paper; extracting at least one first thickness feature and at least one second thickness feature from the first thickness image in the first thickness image; performing average processing on gray values of multiple pixel points in the at least one first thickness feature to acquire a first gray value, and the average processing is performed on gray values of the multiple pixel points in the at least one second thickness feature to acquire a second gray value; when the first gray value is smaller than the second gray value of multiple pixel points in at least one second thickness feature, determining that a thickness of a region, corresponding to the at least one second thickness feature, on the target paper has changed.

Method and apparatus for detecting thickness of paper and storage medium

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Shandong, China

Rongxin Song