International Business Machines Corporation

Rondell K Watts

Jeffrey A Hatley

Raymond J Caggiano

W Peter Soroka

Charles Colpo

Jerry Thomas Paradise

David Timothy Zimmerman

Jeffrey Alan Hatley

According to the preferred embodiments of the present invention, a method of creating and accessing additional test points after circuit board design has been completed is disclosed. The apparatus and methods of the present invention provide test engineers with the ability to leave any circuit interconnections located on the exterior surfaces of a PCB exposed. These exposed circuit interconnections may be identified as access or test points and the apparatus of the present invention is specifically adapted to access, probe, and evaluate these access or test points. To allow the exposed circuit interconnections to be tested without damaging them, the invention includes a new type of probe for use in contacting the exposed traces. The preferred embodiments of the test probe apparatus of the present invention has a relatively flat head to reduce pressure on the circuit interconnections and is coated with dendrites to enhance electrical connectivity between the circuit interconnections and the probe. By using both the apparatus and the methods of the present invention, additional test points may be created on the surface of a PCB after circuit and board design has been completed.

Circuit trace probe and method

A method and apparatus for testing through the connector of a circuit card. The apparatus includes a block, which may be tapered, to offset the force applied when engaging the connector. The block is adjustably mounted to accommodate testing of different-sized circuit cards.

Positive side support test assembly

A tester having as an interconnect structure a pair of resilient, elastomeric, vise-like interconnect grips having conductive tracings thereon. This interconnect structure provides electrical conduction between the conductive tabs of an adapter card under test and the tester.

Probeless fixture for adapter card testing

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Concord, NC, United States of America

Rondell K Watts