Honeywell G.m.b.h.

Ronald R Kusner

David M Comey

Marion B Reine

The present invention is an improvement on the thermal imaging detector of Elliott (U.S. Pat. No. 3,995,195). This detector, which has come to be called the SPRITE detector (Signal PRocessing In The Element), is being applied in serially scanned thermal imaging systems for the 8-12 micrometer infrared spectral band. All such SPRITE detectors to date have been three terminal devices, including two bias contacts at either end of the detector, and one additional readout electrode which, together with the nearby bias contact, define the readout zone across which the integrated photoconductive signal voltage is measured. The present invention recognizes that using a bias contact as one of the two readout electrodes can substantially reduce the spatial frequency response of the SPRITE detector. Thus, the present invention utilizes a four-terminal SPRITE detector configuration in which readout is achieved in a differential manner across two voltage probes. The two voltage probes are located far enough away from the bias contacts so that the bias contacts do not degrade the spatial frequency response.

Non-delineated detector having a differential readout

A device and process for determining the vacuum dewar heat load at cryogenic temperatures by a test made at room temperature are described. The test device comprises a heat source and integral temperature sensor mounted on a probe tip. The heat load of a test dewar at a desired test temperature (e.g. 77K) may be determined by measuring the heat load of the dewar under test at a more suitable test temperature (e.g. room temperature) and multiplying that room temperature heat load by a correlation factor. This correlation factor is empirically determined, and is dependent on the design of the test device and dewar, and the desired and actual test temperatures.

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Concord, MA, United States of America

Ronald R Kusner