Zehntel, Inc.

Ronald N Borrelli

Douglas W Raymond

A method and apparatus for automatic, programmed, in-circuit testing of individual logic elements. A plurality of program-operated device connection switches are provided for making connections to the circuit under test. A plurality of program-operated drive circuits are provided for driving nodes of the logic element under test with controlled current, voltage and power to logical 1, logical 0, or a high impedence state. A measurement unit measures an output from the logic element under test. Testing programs are run in a program-controlled processor. The programs have subroutines which correlate with individual types of logic elements. Each logic element is examined, in circuit, independently of neighboring logic elements. A translation memory stores data for translating node addresses to facilitate topology independent subroutine processing of identical elements.

Programmable tester method and apparatus

A method and apparatus for automatic, programmed, in-circuit component testing and functional testing. A multi-mode measurement unit having an exciter circuit, computing circuit, and a converter circuit is provided for measuring electrical signals. The measurement unit is controlled by a program-commanded measurement unit controller. A plurality of device connection switches are provided for connecting, by a program-commanded switch controller, the computing circuit to selected nodes of a circuit under test. The switch controller and the measurement unit controller receive commands from a programmed processor which executes stored programs of instruction. The programs contain subroutines which correlate with commanded measurement parameters and sequences within the measurement unit.

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Moraga, CA, United States of America

Ronald N Borrelli