Primes Gmbh

Primes Gmbh Mebtechnik Fur Die Produktion MIT Laserstrahlung

Primes Gmbh Meßtechnik Für Die Produktion MIT Laserstrahlung

Primes Gmbh Messtechnik Für Die Produktion MIT Laserstrahlung

Highyag Lasertechnologie Gmbh

Roman Niedrig

Reinhard Kramer

Stefan Wolf

Otto Märten

Johannes Roßnagel

Marc Hänsel

The invention relates to a beam analysis device () for determining the axial position of the focal point () of an energy beam or a sample beam () decoupled from an energy beam, comprising a beam-shaping device (), a detector (), and an analysis device (). The beam-shaping device () is designed to release two sub-beams () from the sample beam () on a plane of the sub-beam release process (). The cross-sections of the two sub-beams () are defined by sub-apertures () which are delimited from each other and which are arranged at a distance k to each other in a first lateral direction (). The beam-shaping device () is designed to image the two sub-beams () in order to form two beam spots () on the detector and deflect at least one of the two sub-beams () in a second lateral direction () which is oriented transversely to the first lateral direction () in order to form a distance w in the second lateral direction () between the two beam spots (). The analysis device () is designed to determine the distance a along the first lateral direction () between positions of the two beam spots () on the detector () and to determine the axial position of the beam focus () on the basis of the distance a and/or to determine a change in the axial position of the beam focus () on the basis of a change in the distance a. The invention also relates to a corresponding method for determining the axial position of a beam focus ().

Device and method for determining a focal point

The invention relates to a method and a device for the analysis of energy beams in systems for the additive manufacture of components () by means of layered solidification of a construction material () by an energy beam (). The invention enables a determination of position-related beam data directly with respect to the processing point during the machining process. An additive manufacturing system includes a beam deflecting device (), a processing plane (), and a layer applicator (). The device according to the invention comprises a movable beam barrier (), a movable beam sampling module () and a measuring device () with a radiation detector ().

Analysis of laser beams in systems for a generative manufacturing process

The invention relates to a method and an apparatus for the direct and precise measurement of the power and/or energy of a laser beam, which make a measurement possible even in areas close to the focus of a laser beam, A device is proposed for this purpose that contains a radiation sensor, an expansion device, and a support mount. The radiation sensor has a receiving surface and is configured for the generation of an electrical signal, which is dependent on the power of the laser beam or the energy of the laser beam. The expansion device and the radiation sensor are positioned on the support mount at a distance from one another. The expansion device is configured in such a way as to increase the angle range of the laser beam. The laser beam propagates to the radiation sensor with an increased angle range. A diameter of the laser beam propagated on the receiving surface is greater than a diameter of the laser beam in the area of the expansion device. The receiving surface of the radiation sensor encloses at least 90% of the cross-section surface of the laser beam propagated.

Beam power measurement with widening

The invention relates to a measuring probe for scanning light beams () or laser beams. The measuring probe is suitable for scanning laser beams with very high power and for determining geometric parameters of a light beam () with high spatial resolution. For this purpose, a device is proposed which comprises a body (), a probe area () and a detector (). The body () is made of an optically transparent material and has a light beam entry surface (), a light beam exit surface () and a detection light exit surface (). The light beam entry surface () and the light beam exit surface () are for the most part smooth and polished. The body () includes the probe area () having light-deflecting structuring. The detector () is designed to detect at least part of the beam portion () deflected from the light beam () by the probe area (). The body () and the light beam () are movable in two different directions of movement () perpendicular to the direction of the axis () of the light beam () relative to each other. The probe area () has a shape whose two-dimensional projection on a surface perpendicular to the axis () of the light beam () approximately the same dimensions in the two different directions of movement () perpendicular to the axis () of the light beam ().

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Berlin, Germany

Roman Niedrig