Centre National Detudes Spatiales

Credence Systems Corporation

Dcg Systems Gmbh

Vega France

Centre National D'edutes Spatiales

Romain Desplats

Philippe Perdu

Steven Kasapi

William K Lo

Patricia Le Coupanec

Olivier Crepel

Felix Beaudoin

Bruno Benteo

Theodore R Lundquist

Ketan Shah

Kevin Sanchez

Félix Beaudoin

Kenneth R Wilsher

Praveen Vedagarbha

Martin D Leibowitz

Jean-Louis Lopez

Guy Rolland

Frederic Fevrier

Michaël Obein

Kévin Sanchez

Sébastien Domeny

Disclosed is a method of controlling a calculation device via a mobile element to generate at least one control command associated with its vectorial orientation. The mobile element includes sensors able to provide relative measurements and absolute measurements. The method includes the following steps: provision of an initial vectorial orientation; taking of measurements by the set of sensors; determination of a first elementary vectorial orientation from relative measurements and the prior vectorial orientation; determination of a second elementary vectorial orientation from absolute measurements; determination of the current vectorial orientation from the first and second elementary vectorial orientations; and association of a control command.

Method of controlling a calculation device via a mobile element and control system implementing this method

The invention relates to a method for exposing an integrated circuit by ablating the polymer coating initially covering the integrated circuit, characterized in that it includes the combined application of a laser radiation and a plasma onto the coating initially covering the integrated circuit.

Method and installation for exposing the surface of an integrated circuit

A wind-powered device for producing electrical energy includes an electric generator set () which works by converting mechanical energy into the electrical energy, a wind-powered set () designed to capture the energy of the wind and convert it into mechanical energy, a transmission () positioned between the wind-powered set () and the generator set (), the transmission () being designed to transmit mechanical energy produced by the wind-powered set () to the generator set (), characterized in that the wind-powered set () includes at least two air turbines known as wind turbines () including non-coaxial shafts () coupled to the transmission (), the wind turbines () being designed in such a way as to present an equivalent surface area to the wind that exceeds the surface area exposed to the wind of each of the wind turbines ().

Wind-powered device for producing electrical energy

The invention relates to a method for analyzing an integrated circuit, including a step for applying laser radiation at a point on the surface of the circuit, a step for exciting the circuit thus subjected to laser radiation by applying an electrical excitation signal, a step for collecting the response of the circuit to the excitation, the circuit being subjected to laser radiation, and a step for measuring the phase difference between the response to the excitation of the circuit subjected to laser radiation and a reference response of the circuit in the absence of laser radiation applied to the circuit. The invention also relates to an associated observation method and installation.

Method of analyzing an integrated circuit, method of observation and their associated installations

A device (10) for analyzing a circuit (14) includes at least one element (22) for observing light emitted by at least one localized observation zone of the circuit resulting from the electric current flowing in the zone; elements (26) for exciting the circuit. The circuit exciting elements include a laser source (26) and elements (30) for applying a laser beam generated by the source on the observation zone (22). The device includes members (M1, M2) for protecting the observation zone (22) against the incident and reflected laser beams.

Device for analyzing an integrated circuit

A method and installation for analyzing an integrated circuit. The method includes, for a plurality of surface points of the integrated circuit, the following steps: applying a laser radiation, in one point of the surface of the integrated circuit; exciting the circuit; collecting the response of the circuit to the excitation; calculating the propagation time intervening between the excitation time and the response-collecting time; and creating an image of the integrated circuit showing a value representing the propagation time at each point of laser radiation application.

Method and installation for analyzing an integrated circuit

A system, apparatus, and method for analyzing photon emission data to discriminate between photons emitted by transistors and photons emitted by background sources. The analysis involves spatial and/or temporal correlation of photon emissions. After correlation, the analysis may further involve obtaining a likelihood that the correlated photons were emitted by a transistor. After correlation, the analysis may also further involve assigning a weight to individual photon emissions as a function of the correlation. The weight, in some instances, reflecting a likelihood that the photons were emitted by a transistor. The analysis may further involve automatically identifying transistors in a photon emission image.

Apparatus and method for detecting photon emissions from transistors

A device () used to measure at least one component of a magnetic field, includes a magnetoresistive sensor () and a measuring chain (). The input of the measuring chain is connected to the magnetoresistive sensor (), while the output thereof is intended to supply information that is representative of the magnetic field in the region of the sensor. In addition, the measuring chain () includes elements () for isolating a frequency component of the signal from the sensor representative of the magnetic field for a unique pre-determined frequency (FI).

Magnetic-field-measuring device

A magnetic-field-measuring probe includes at least one magnetoresistive or magnetoinductive sensor which is sensitive to the magnetic field along a privileged measurement axis. The probe includes: at least two magnetoresistive or magnetoinductive sensors () which are rigidly connected to one another in a position such that the privileged measurement axes thereof are parallel and offset in relation to one another in a direction that is transverse to the privileged measurement axes; and output terminals specific to each magnetoresistive or magnetoinductive sensor, in order to supply a signal that is representative of the magnetic field measured by each sensor along the privileged measurement axis thereof.

Magnetic-field-measuring probe

A magnetic-field-measuring probe includes at least two magnetoresistive sensors which are sensitive to respective magnetic fields along a determined measurement axis. The at least two magnetoresistive sensors are rigidly connected to one another in a position such that the measurement axes thereof are at an angle other than zero. Output terminals specific to each magnetoresistive sensor are used to supply a signal that is representative of the field measured by each sensor along the measurement axis thereof. The difference between the derivative of a first magnetic field relative to a second direction and the derivative of a second magnetic field relative to a first direction is calculated to determine a component of current to be measured.

Device for measuring a component of current based on magnetic fields

A customizing method includes steps which consist in: a) determining on the basis of a circuit model, a set of vectors each corresponding to a theoretical operating time of the circuit when a predetermined sequence of tests is applied, the coefficients of each vector representing the state of a common set of elements of the circuit among which the element to be customized (); b) defining on the basis of a comparison of vectors, a composite of logic operators applied on the vectors and enabling to extract the coefficient corresponding to the element to be customized (); c) producing images of the operating circuit at times corresponding to the vectors whereon is applied the composite of logic operators (); and d) graphically combining the images produced in accordance with a composite of graphic operators corresponding to the composite of logic operators ().

Method for customizing an integrated circuit element

A process and installation for automatic optimal location of a servicing operation on an integrated circuit. The accessible polygons are retrieved on the basis of topographic descriptive data and data representing the electrical circuit. For each step, different execution options are determined, each corresponding to each of the different accessible polygons, and a rating is calculated and assigned to each execution option as a function of the depth of each possible initial polygon with respect to the access surface, and of accessibility parameters of each possible initial polygon, and the optimal execution option to be used for executing each step of the servicing operation is determined automatically by a numerical optimization calculation using the ratings assigned to the different execution options of each step of the servicing operation.

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Toulouse, France

Romain Desplats