Leica Microsystems Cms Gmbh

Gira Giersiepen Gmbh & Co. Kg

Tapko Technologies Gmbh

Roland Seifert

Bernd Widzgowski

Hilmar Gugel

Frank Schreiber

Marcus Dyba

Patric Mrawek

Jonas Fölling

Arnold Giske

Harald Kemmann

Juergen Schneider

Claus Kress

Petar Tomic

Rolf Molitor

André Dornseiff

Matthias Nawrocki

Klaus Adler

Ingo Laskiwitz

Accessory for a microscope

An adjustable mechanical holder for finely adjusting a position of an element attachable or attached to the mechanical holder includes a stationary fastening region configured to fasten the mechanical holder to a holding structure and a holding region configured as a mounting for the element. At least a first parallelogram linkage is disposed between the holding region and the fastening region. The first parallelogram linkage connects the holding region movably to the fastening region. The mechanical holder further includes a first movable actuator, by which the holding region is movable by the first parallelogram linkage along a first spatial direction.

Adjustable mechanical holder for finely adjusting the position of an element such as a lens

A detector device is designed to capture light and to generate electrical signals. The detector device includes a housing and a detector disposed in the housing so as to be moveable at least partially in the housing and with respect to the housing. The detector device is useable in a detection system and/or in a microscope.

Detector device with improved signal-to-noise ratio comprising a detector in a housing moveable against a force of a spring device

An optical device includes: a focusing optic that focuses a light beam in a focal plane; at least two phase filters for selectively focusing the light beam and effecting a phase shift of the light beam; and a filter wheel supporting the at least two phase filters which are individually introducible along an optical axis of the light beam, where the filter wheel is rotationally adjusted in relation to the optical axis by a stepper motor and linearly adjusted in an r-direction along a plane of the filter wheel by a linear adjustment mechanism.

Phase filters for a scanning microscope

A device and method for adjusting mounting of a microscope stage (), to which an objective () is mounted, to a microscope stand (), including at least one first connecting element () arranged on the microscope stand (), at least one second connecting element () arranged on the microscope stage () for mounting the microscope stage () to the microscope stand (), at least one first mating part () arranged on the microscope stand (), at least one positioning base () supporting a second mating part (), wherein the positioning base () adjusts the platform () on the microscope stand () and is mounted movably in a plane of adjustment that is parallel to the platform () with the mating parts () being engaged, and at least one locking device () for locking the positioning base () to the platform ().

Device and method for the adjusted mounting of a microscope stage to a microscope stand

A microscope stage () comprising a platform () and a holder () for a microscope objective (), which holder is mounted on the platform () pivotally about a bearing axis () and movably along the bearing axis () and holds the objective (), an operating element () which is coupled to the holder () and with which the holder () is pivotable about the bearing axis () and is movable along the bearing axis () for its positioning in an operating position, and a locking mechanism () which is actuatable by the operating element () and with which the holder () positioned in the operating position can be fixed to the platform ().

Microscope stage with pivotable objective holder

A microscope stage () comprising a platform (), a specimen holder () resting on the platform () and a positioning device () for moving the specimen holder () in a plane of displacement parallel to the platform () is described. The microscope stage () includes a positioning device () having two displacing devices () which are mechanically decoupled from each other and of which a first displacing device () is designed to move the specimen holder () along a first axis in the plane of displacement, and a second displacing device () is designed to move the specimen holder () along a second axis in the plane of displacement, which second axis runs transversely to the first axis.

Microscope stage

An objective changer for a microscope includes a changing device configured to pendulously swing each of a plurality of objectives into a respective operating position near a focal position.

Objective changer and a microscope

An apparatus for adjusting a microscope stage. The microscope stage of the apparatus defines a plane on which an object to be examined can be placed. The apparatus further includes a first shaft and a second shaft rotationally coupled to the first shaft. The microscope stage is guided between the first and second shafts such that a rotational movement of at least one of the first and second shafts has a direct effect on the microscope stage.

Apparatus for adjusting a microscope stage

A photomultiplier system includes a detector tube, a power supply unit, and a thermal isolation element. The power supply unit provides an accelerating voltage for operating the detector tube. The detector tube and the power supply unit are disposed on different sides of the thermal isolation element.

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Heidelberg, Germany

Roland Seifert