Analytik Jena Gmbh+co. Kg

Analytik Jena Gmbh

Analytik Jena Ag

Roland Lehmann

Iouri Kalinitchenko

Wolfram Weisheit

The present disclosure includes a mass spectrometry apparatus for analyzing an analyte sample, which comprises: an ion source from which a quantity of analyte ions from the analyte sample may be sourced for providing an ion beam; a mass analyzer serving to filter the analyte ions of the ion beam based on their mass-to-charge ratio; a first detector unit for analyzing the ions of the ion beam; and a second detector unit being based on the time-of-flight principle and comprising a second detector for analyzing the ions of the ion beam. The present disclosure further includes a method for analyzing an analyte sample using a mass spectrometry apparatus according to the present disclosure.

Hybrid mass spectrometry apparatus

The present disclosure relates to a method for determining the necessity of an action and/or a success of an action involving water, especially drinking water, process water or waste water, including steps as follows: providing a retentate of a water filter present in a water conveying line, analyzing the retentate regarding at least one property and/or its chemical composition, and determining the necessity or success of the action and, in given cases, deriving the action from the analysis. Furthermore, the present disclosure relates to a system including a means for providing the retentate of a water filter in a water conveying line and a measuring/analytical means for performing the analysis.

Method for analysing water

A method of operating an inductively coupled plasma mass spectrometry apparatus for analyzing an analyte sample, the mass spectrometry apparatus including a plasma ion source, a mass analyzer and an interface arrangement positioned between the plasma ion source and the mass analyzer of the mass spectrometer, the interface arrangement at least including an interface structure, including a sampling or skimmer cone, and at least one passage with an inlet and an outlet into a reaction zone, the method including: generating a plasma using the plasma ion source and forming a plasma flux to flow towards the mass analyzer; supplying the analyte sample into the reaction zone via the passage such that the analyte sample interacts with the plasma flux; and analyzing the analyte sample using the mass analyzer.

Mass spectrometry apparatus

The present disclosure includes a computer-implemented method for filtering out at least one selected ion from an ion beam by the following steps: determining the selected ion with a selected ion mass, selected charge and/or selected mass to charge ratio; determining at least one predefinable region with predefinable ions, whose ion masses, charges and/or mass to charge ratios are greater than or smaller than the selected ion mass, the selected charge and/or the selected mass to charge ratio of the selected ion; isolating the predefinable region of the ion beam along a trajectory of the ion beam, and detecting the predefinable ions within the predefinable region. In addition, the present disclosure includes to a computer program which is configured to perform a method according to the present disclosure and to a computer program product having the computer program.

Dynamic ion filtering for reducing highly abundant ions

The present disclosure relates to a device for filtering at least one selected ion from an ion beam includes a unit for creating an electric field for accelerating the ions of the ion beam along a flight path of predefinable length, and a controllable ion optical system, which delimits the flight path in one direction, and which is used to deflect the selected ion from a flight path of the ion beam. The device is further designed to control the ion optical system subject to a flight time of the selected ion along the flight path. The present disclosure also relates to a mass spectrometer having a device according to the present disclosure, and to a method for filtering at least one selected ion from an ion beam.

Growing community of inventors

Jena, Germany

Roland Lehmann