Cavium, Inc.

Rohan Arora

Scott E Meninger

Jonathan K Brown

An apparatus includes a plurality of semiconductor devices and an electrical input device for applying voltage to the plurality of semiconductor devices. There is a switching array configured to sequentially interconnect the electrical input device to each of the semiconductor devices and disconnect the other semiconductor devices from the electrical input device. The semiconductor device connected to the electrical input device is a device under test that produces a test current and the other semiconductor devices are devices not under test that produce, in the aggregate, a leakage current. There is an output node interconnected to the switching array for enabling the measurement of the test current at the output node. There is also a leakage current compensator connected to the output node and the switching array that is configured to divert the leakage current away from the output node.

Testing semiconductor devices

A system on chip (SOC) includes a clock generator to provide one or more on-chip reference clocks to a number of physical medium attachments (PMAs) across a common clock bus. The clock generator receives one or more external, off-chip clock lines, from which it generates the on-chip reference clocks. Each of the PMAs may operate data input/output (I/O) channels under a variety of different communications protocols, which can have common or distinct reference clock frequencies. Accordingly, the on-chip reference clocks are generated to provide the required reference clocks to each of the PMAs.

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Marlborough, MA, United States of America

Rohan Arora