Micron Technology Incorporated

Semiconductor Components Industries, LLC

Round Rock Research, LLC

Aptina Imaging Corporation

California Institute of Technology

Photobit Corporation

Roger Panicacci

Eric R Fossum

Alexander I Krymski

Barmak Mansoorian

Christopher Clark

Sandor L Barna

Kwang-Bo Cho

Bedabrata Pain

Jeffery S Beck

Giuseppe Rossi

Marko Mlinar

Robert H Nixon

Timothy J Shaw

Barry Vanhoff

Jeff D Bruce

Brita H Olson

Tim W Chan

Nick Doudoumopoulos

Scott Yee

Guiseppe Rossi

Imaging circuitry may include circuits for implementing feature extraction in the analog domain. The imaging circuitry may include pixels configured to generate pixel values. The pixel values may then be weighted using variable charge integration times, variable resistors in the readout path, and/or variable switch on times in the readout path. The weighted pixels values may be binned and combined to obtain an output neuron voltage for at least one layer in a neural network. Performing feature extraction in the analog domain for each layer of results in the neural network saves power and area by avoiding the need to move data around to conventional digital memories.

Imaging systems and methods for performing pixel binning and variable integration for analog domain regional feature extraction

An image sensor may include an array of image pixels coupled to analog-to-digital conversion circuitry formed from pinned photodiode charge transfer circuits. Majority charge carriers for the pinned photodiodes in the charge transfer circuits may be electrons for photodiode wells formed from n-type doped regions and may be holes for photodiode formed from p-type doped regions. Pinned photodiodes may be used for charge integration onto a capacitive circuit node. Pinned photodiodes may also be used for charge subtraction from a capacitive circuit node. Comparator circuitry may be used to determine digital values for the pixel output levels in accordance with single-slope conversion, successive-approximation-register conversion, cyclic conversion, and first or second order delta-sigma conversion techniques. The array of image pixels used for imaging may have a conversion mode wherein at least a portion of the pixel circuitry in the array are operated similar to the charge transfer circuits.

Charge packet signal processing using pinned photodiode devices

An image sensor may include an array of image sensor pixels. Each image sensor pixel may have signal storage capabilities implemented through a write-back supply line and a control transistor for the supply line. Each image sensor pixel may output pixel values over column lines to switching circuitry. The switching circuitry may route the pixel values to signal processing circuitry. The signal processing circuitry may perform analog and/or digital processing operations utilizing analog circuits or pinned diode devices for image signal processing on the pixel values to output processed pixel values. The processing circuitry may send the processed pixel values back to the array. This allows the array to act as memory circuitry to support processing operations on processing circuitry in close proximity to the array. Configured this way, signal processing can be performed in close proximity to the array without having to move pixel signals to peripheral processing circuitry.

Image pixels having processed signal storage capabilities

An image sensor may have an array of pixels and readout circuitry. The array may include image pixels that generate signals in response to image light and reference pixels that generate signals in response to electrical noise. The readout circuitry may obtain first pixel values from the image pixels and may obtain second pixel values from the reference pixels. The readout circuitry may generate an extended precision pixel value based on the second pixel values that have an extended bit width relative to the each of the second pixel values. The readout circuitry may generate multiple dithered correction values by adding randomized sequences of least significant bits to the extended precision pixel value. The readout circuitry may mitigate visible quantization error and noise such as row-correlated and column-correlated noise in the final image by subtracting the dithered correction values from corresponding first pixel values.

Imaging systems and methods for mitigating pixel data quantization error

An imaging device that stores charge from a photosensor under at least one storage gate. A driver used to operate the at least one storage gate, senses how much charge was transferred to the storage gate. The sensed charge is used to obtain at least one signature of the image scene. The at least one signature may then be used for processing such as e.g., motion detection, auto-exposure, and auto-white balancing.

Method and apparatus providing pixel storage gate charge sensing for electronic stabilization in imagers

Methods, apparatus and systems may operate to copy pixel charge, compensating for image subject shift within in an imaging array during exposure time of an imaging device. Activities may include transferring charge from one or more source pixels to one or more buffer pixels within the same pixel array, and copying the charge to destination pixels within the same pixel array prior to an end of the image integration time. Charge transfer may include transfer of charge from more than one array on a single die. Additional activities may include transferring charge from one or more source pixels to one or more destination pixels multiple times prior to the end of the image integration time.

Pixel to pixel charge copier circuit apparatus, systems, and methods

Automatic exposure adjusting device considers the image on a pixel-by-pixel basis. Each pixel is characterized according to its most significant bits. After the pixels are characterized, the number of pixels in any particular group is counted. That counting is compared with thresholds which set whether the image is over exposed, under exposed, and can optionally also determine if the image is seriously over exposed or seriously under exposed. Adjustment of the exposure is carried out to bring the image to a more desired state.

Method of operating an image sensor having a digital exposure circuit

An imaging device having pixels that store charge from a photosensor under at least one storage gate during a sampling period. A driver used to operate the at least one storage gate, estimates how much charge in the pixel exceeds a predetermined limit during a non-destructive pixel sensing operation. A specific voltage is stored on the pixel's floating diffusion region to flag how many times the pixel exceeded the limit. The final pixel signal and the stored information is readout at the end of integration period to create a sum that represents the pixel's final signal value.

Skimmed charge capture and charge packet removal for increased effective pixel photosensor full well capacity

Digital exposure circuit for an image sensor

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Los Angeles, CA, United States of America

Roger Panicacci