Teradyne, Inc.

Roger Allen Sinsheimer

Brian Charles Wadell

David Walter Lewinnek

Vladimir Vayner

Luis Antonio Valiente

Frank Parrish

Jonathan Hanes Williams

Timothy Daniel Lyons

Brian G Donovan

Gary Fowler

Craig Anthony DiPalo

Andreas Flieher

Brandon E Creager

Daniel L Engel

Michael Peter Hascher

Leal J Daniels

An example waveguide connector is for making a blind-mate electrical connection between a first waveguide and a second waveguide. The waveguide connector includes a male part connected to the first waveguide, where the first waveguide includes a first conductive channel, and a female part connected to the second waveguide, where the second waveguide includes a second conductive channel. The female part includes a receptacle into which the male part slides to create the blind-mate electrical connection between the first conductive channel and the second conductive channel. A self-alignment feature is on at least one of the male part or the female part. The self-alignment feature is configured to guide the male part into the receptacle while correcting for misalignment of the male part and the female part.

Waveguide connector for connecting first and second waveguides, where the connector includes a male part, a female part and a self-alignment feature and a test system formed therefrom

An example contact head includes coaxial contacts configured for transmission of radio frequency (RF) signals or digital signals between a test system and a device under test (DUT). Each of the coaxial contacts is configured to target a specific impedance. Each of the coaxial contacts includes a coaxial structure having an open-curve shape. The coaxial structure includes a spring material that bends in response to applied force and that returns to the open-curve shape absent the applied force. The coaxial structure includes a center conductor terminating in a contact pin and a return conductor separated by a dielectric from the center conductor. At least part of the center conductor and the return conductor include an electrically-conductive material. Flexible contacts on the coaxial contact include the electrically-conductive material.

Coaxial contact having an open-curve shape

An example test system includes a test head, and a device interface board (DIB) configured to connect to the test head. The DIB is for holding devices under test (DUTs). The DIB includes electrical conductors for transmitting electrical signals between the DUTs and the test head. Servers are programmed to function as test instruments. The servers are external to, and remote from, the test head and are configured to communicate signals over fiber optic cables with the test head. The signals include serial signals.

Automatic test equipement having fiber optic connections to remote servers

An example system includes a receptacle to house a device under test (DUT); an antenna for exchanging signals with the DUT, where at least some of the signals are for use in performing radiated testing of the DUT; and a cap configured to mate to the receptacle to form a housing to enclose the DUT. The housing is for isolating the DUT at least one of physically or electromagnetically.

Handler change kit for a test system

An example system includes a circuit board having electrical elements; a wafer having contacts; and an interconnect to route signals between the electrical elements and the contacts. The interconnect includes multiple layers, each of which includes a flexible circuit. The flexible circuit includes a conductive trace disposed thereon. The interconnect also includes shielding between adjacent layers of the multiple layers. The shielding is electrically connected to ground.

Coaxial structure for transmission of signals in test equipment

An example method includes: for a component supported by an air bearing, detecting a speed of movement of the component relative to a predefined location, the air bearing generating an air flow to elevate the component relative to a ground plane; and controlling the air bearing based, at least in part, on the speed detected.

Braking system

An example circuit board structure includes: a substrate; and vias that are electrically conductive and that pass through the substrate to enable electrical connection through the circuit board structure. The substrate is thinner, and lengths of the vias are shorter, in first areas of the circuit board structure that deliver first speed signals than in second areas of the circuit board structure that deliver second speed signals and power. The first speed signals have a shorter rise time than the second speed signals.

Pocketed circuit board

An example structure for transmitting signals in an application space between a device under test (DUT) and test electronics includes: a circuit board that is part of an application space between test electronics and a device under test (DUT); and a coaxial structure to pass signals along electrical pathways between the test electronics and the DUT. The coaxial structure includes a signal line at least partially surrounded by a return line.

Structure for transmitting signals in an application space between a device under test and test electronics

A system includes: a circuit board including electrical elements arranged at a first pitch; a wafer including contacts arranged at a second pitch, where the second pitch is less than the first pitch; and an interconnect including additively-manufactured electrical conduits that are part of an electrical pathway between the electrical elements and the contacts, where the additively-manufactured electrical conduits include electrically-conductive material.

Growing community of inventors

Camarillo, CA, United States of America

Roger Allen Sinsheimer