Panalytical B.v.

Roelof De Lange

Bruno A R Vrebos

A device () for the examination of at least one material sample () which can be inserted into the device () and is irradiated by means of electromagnetic waves (), notably X-rays; in the measuring position the material sample () can be subjected to irradiation by means of the electromagnetic waves () and during a change of sample the beam path () can be interrupted by means of a closure element () which can be moved into the beam path. The device is constructed in such a manner that the closure element () is provided with a reference sample () on its side which faces the rays () in a manner such that a reference measurement can be performed thereon during a change of sample.

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Falmer, Netherlands

Roelof De Lange