Koninklijke Philips Corporation N.v.

Roelant Visser

Michael Overdick

Hans-Aloys Wischmann

Ralf Schmidt

The invention relates to a method for the correction or compensation of individual differences between the conversion characteristics of the image sensors () and the processing units () of an X-ray detector which are connected thereto. It is assumed that a functional relationship in conformity with GW=F(L(&#x3c6;)) exists between the quantity of radiation (&#x3c6;) entering the detector and the grey value (GW) resulting therefrom for a pixel (j, i), where Lij describes the approximately linear behavior of the sensor arrangement () and Fi the non-linear behavior of the processing unit (). For the inverse value La linear model function is used and for the inverse value Fa non-linear model function is used with parameters which can be calculated from calibration measurements with different radiation quantities (&#x3c6;). During later operation of the detector these model functions can be applied to the grey values (GW) obtained in order to correct said grey values with a high precision and in real time, the storage space then required being small as a result of the use of a single non-linear inverse value for each column.

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Eindhoven, Netherlands

Roelant Visser