United States of America As Represented by the Administrator of Nasa

Analytical Mechanics Associates, Inc.

Rodolfo I Ledesma

John W Connell

William T Yost

Daniel F Perey

Frank L Palmieri

John W Hopkins

Joshua L Brown

Paul Petzar

A probe for collecting optically stimulated electron emission to inspect chemical reactions of a surface includes a light source to emit light on the surface, a collector, and a controller. The light source emits light on the surface. The collector is configured to detect photoelectrons emitted from the surface in response to the light from the light source impinging on the surface. The collector is further configured to provide a photocurrent based on the detected photoelectrons. The controller includes at least one processor and is operably coupled to the light source and the collector. The controller is configured to cause the light source to emit light on the surface, receive the photocurrent from the collector, and determine at least one chemical reaction of the surface based on the received photocurrent.

Adsorbate analysis using optically stimulated electron emission

Systems, methods, and devices of the various embodiments may enable simultaneous preparation of a substrate for adhesive bonding and detection of minute contaminants on the substrate. Various embodiments may enable detection of contaminants on a surface of a substrate while the surface of the substrate is being prepared for adhesive bonding by laser ablation. Various embodiments may provide an integrated laser treatment and measurement system.

Laser surface treatment and spectroscopic analysis system

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Hampton, VA, United States of America

Rodolfo I Ledesma