Analog Devices,inc.

Analog Devices Global

Analog Devices International Unlimited Company

Roderick McLachlan

Gavin Patrick Cosgrave

Avinash Gutta

Fergus John Downey

Alan Gillespie

Teng-Hee Lee

Colin Gerard Lyden

Dennis A Dempsey

Michael C Coln

Geoffrey Thomas Haigh

Roberto Sergio Matteo Maurino

Tudor M Vinereanu

Patrick C Kirby

Roger Peppiette

Samuel Blackburn

Described are various techniques that can minimize the use of high-voltage devices in a unity-gain buffer that can be used in a high voltage application, while providing a circuit that generates an output that is an accurately buffered version of the input.

High-voltage unity-gain buffer

A converter circuit is provided that includes an amplifier circuit and further includes: a summing current resistor that exhibits nonlinear resistance coupled between a voltage node and a summing current node of the amplifier; a compensation resistor circuit includes resistors that exhibit nonlinear resistance; the compensation resistor circuit produces a compensation current at the summing current node that compensates for nonlinear current flow in the summing current resistor.

Resistor linearization during current and voltage conversion

A digital-to-analog converter (DAC) comprising a first section having a first plurality of current flow paths forming binary weighted values in the DAC; and a second section connected to the first section and having a second plurality of current flow paths, wherein each of the first and second plurality of current flow paths are switchable between first and second nodes, and wherein weights of one or more of the second plurality of current flow paths are notionally equal to weights of one or more of the first plurality of current flow paths so as to provide redundancy in the first section.

Digital-to-analog converter and a method of operating a digital-to-analog converter

A data converter can include a resistor network, a switch network connected to the resistor network and having a plurality of switch circuits, each with an NMOS and a PMOS switch transistor, and a voltage generator to generate a drive voltage for driving a gate of at least one of the NMOS or PMOS switch transistors of at least one of the switch circuits. The voltage generator can include first and second pairs of transistors, each pair having connected control terminals and being connected to a second NMOS or PMOS transistor, a first or second resistor, and the other pair of transistors. The first and second resistors can have substantially equal resistance values. A ratio of width-to-length ratios of the second NMOS to PMOS transistors can be substantially equal to such a ratio of the switch circuit NMOS to PMOS transistors.

Voltage generator, switch and data converter circuits

A digital-to-analog converter (DAC) includes a resistor leg that is switchably connected to a first voltage reference via an n-channel MOSFET and to a second voltage reference via a p-channel MOSFET, and a generator circuit. The generator circuit further includes a first sub-circuit for generating a drive voltage (Vgn) and a second sub-circuit for a) offsetting the first drive voltage by an offset voltage to generate a second drive voltage, and b) supplying the second drive voltage to a gate of one of the first NMOS and the first PMOS.

Digital-to-analog converter with controlled gate voltages

The invention provides a systematic error correction network coupled to a converter. The converter may display a systematic non-linearity error, and the systematic error correction network shapes a correction transform function that acts like counter distortion function for the non-linearity error. The systematic error correction network then scales the correction transform function according to a reference variable, where the magnitude of non-linearity error is related to the reference variable. The scaled correction transform function is then applied to the converter path in order to generate a corrected analog output signal.

Programmable linearity correction circuit for digital-to-analog converter

A force/sense voltage-mode DAC coupled with multiple transconductance amplifiers that generate a correction current injected to a node in one of the DAC cells is discussed. The correction current injected into the DAC cell may reduce nonlinearity produced by biasing current to the operational amplifiers in the DAC.

Linearity correction circuit for voltage mode DAC

The invention is a novel scheme of calibrating a voltage-mode digital to analog converter using a current-mode digital to analog converter. A DAC system is comprised of a voltage-mode DAC with an R-2R architecture structure and includes a ROM lookup table where calibration codes associated with each of a plurality of input codes are stored. A reference current is scaled with the calibration codes to output a calibration current that induces adjustments in an output voltage to counteract non-linearities that may be induced by resistor mismatch.

Voltage mode DAC with calibration circuit using current mode DAC and ROM lookup

A digital to analog converter (DAC) includes a pair of operational amplifiers each having a first input coupled to a respective high or low reference voltage. The DAC includes a plurality of switch-controlled cells, each of which includes a resistor and two force/sense switch pairs. Within each cell, all four switches are coupled to the resistor. A first force switch is coupled to an output of a first op amp and an associated sense switch is coupled to an inverting input of the first op amp. A second force switch is coupled to an output of a second op amp and an associated sense switch is coupled to an inverting input of the second op amp. Thus, the force switches provide selectively conductive paths to permit either op amp to drive a given cell. When an op amp drives particular cells, sense switches generate multiple a feedback paths to the driving op amp, which permits the op amp to drive the selected cell resistors at voltages that overcomes any voltage losses induces by associated force switches, and cancels the effect of any variation in the voltage losses induced by different force switches. The switch-controlled cells find application in a variety of DAC architectures, including binary weighted R2R architectures, equally-weighted segmented architectures or hybrid architectures that blend principles of R2R and segmented architectures.

Digital to analog converters having circuit architectures to overcome switch losses

The invention provides a multi-channel DAC circuit which provides for correlation between selected ones of the multiple channels such that a single set of calibration coefficients may be used for calibration of multiple channels.

Digital to analog converter with shared calibration

A digital to analog converter comprising: a digital to analog conversion core adapted to receive at least one reference voltage and a digital word to be converted, and to output an analog voltage as a function of the digital word and the at least one reference voltage; a sensing circuit for sensing a difference between a first ground voltage associated with an output of the digital to analog converter and a ground reference voltage occurring at the digital to analog converter; and a compensation circuit for applying a compensation voltage to the at least one reference voltage used by the conversion core of the digital to analog converter.

Digital to analog converter and a ground offset compensation circuit

A sub-ranging DAC converter is provided where voltage followers rather than operational amplifiers are used to avoid loading a main resistor string.

Digital to analog converter

A read-write interface system and method for a peripheral device includes storing data to be processed by a peripheral device; receiving a set of input data bits; transferring the set of input data bits from the shift register to the latch circuit in a write operation; accessing a leading bit of the set of input data bits from the latch circuit in advance of a read operation; and enabling in a read operation the rest of the input data bits in the latch circuit to be transferred to the shift register to be output with the leading bit.

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Edinburgh, United Kingdom

Roderick McLachlan