Infineon Technologies Ag

Other

Infineon Technologies Austria Ag

Roderick McConnell

Detlev Richter

Jens Barrenscheen

Wolfgang Anton Spirkl

Bernhard Strzalkowski

Peter Ossimitz

Sebastian Kuhne

Thomas Janik

An example system learns from traffic disturbances or perturbations to improve overall traffic flow. The perturbations may be related to specific times such as morning rush hour, or for all times of day. The improvement to overall traffic flow may be measured by time lost in traffic delays, or by time of travel, or by risk of accidents.

Traffic disturbances

A traffic metering system for metering access to at least one metered segment, configured to receive requests from one or more vehicles announcing a destination and a requested arrival time, and to authorize the vehicles to enter a metered segment based on a schedule for the at least one metered segment. Vehicles configured for use in the metering network announce a request for destination and arrival time to the metering network and the metering network authorizes the vehicle to enter the metered segment based on a schedule for the at least one metered segment.

Traffic metering system

The disclosure relates to a circuitry including a first contact connected to a power supply, a first compare unit connected to the first contact and to a first reference signal, wherein the first compare unit is configured to compare a voltage at the first contact with the first reference signal and provide a first output signal for further processing.

Circuitry and method for monitoring a power supply of an electronic device

A circuit arrangement includes a coreless transformer. A trimming device is connected to the transformer and includes a variable capacitance and/or inductance.

Trimmable transformer arrangement

Data signals are transmitted between a number of semiconductor chips which are connected to one another in a common chip package. For that a signal transmission arrangement is set up for a transmission of the signals via in each case one transmitting/receiving interface which is arranged at the chip ends of a power supply connection which connects the number of semiconductor chips.

Signal transmission arrangement and method

A method and a configuration for the output of bit error tables from semiconductor devices are described. A test control unit reads the bit error table from the memory device following a request from the test apparatus. Then, the bit error tables are transmitted sequentially to the test apparatus for further processing.

Method and configuration for the output of bit error tables from semiconductor devices

A method of checking the operation of memory cells. A first group of memory cells and a second group of memory cells are provided. The first group of memory cells is tested and a first set of test results is obtained, and the first set of test results is stored in the second group of memory cells. The first set of test results is read from the second group of memory cells. The second group of memory cells is tested and a second set of test results is obtained. The second set of test results is stored in the first group of memory cells. The test results can be compressed before they are output. Errors can be corrected by using an error correction code or duplicate copies of the test results. The method allows a test device to be provided that does not have memory. The complexity of the test device is therefore advantageously reduced. An electronic circuit is provided that includes a first group of memory cells, a second group of memory cells, and a test device programmed such that the method can be performed.

Growing community of inventors

Munich, Germany

Roderick McConnell