Cascade Microtech, Inc.

Rod Jones

Peter McCann

Anthony James Lord

Craig Stewart

Jeff Spencer

Terry Burcham

John L Dunklee

Tim Lesher

Brad Froemke

Peter Navratil

Scott Runbaugh

Gavin Fisher

David Newton

Pete McCann

A test configuration for double sided probing of a device under test includes a holder to secure the device under test in a first orientation, a calibration substrate secured in a second orientation and a probe capable of calibration using the calibration substrate and probing the device under test.

Double sided probing structures

A chuck includes a conductive element that contacts a device under test in a location on the chuck. The chuck includes an upper surface for supporting a device under test and a conductive element that extends through the chuck to the upper surface of the chuck. The conductive element is electrically isolated from the upper surface of the chuck, and makes electrical contact with any device under test supported by the chuck.

Chuck for holding a device under test

A chuck that includes an upper surface for supporting a device under test and a conductive element that extends through the chuck to the upper surface of the chuck. The conductive element is electrically isolated from the upper surface of the chuck, and makes electrical contact with any device under test supported by the chuck.

A probe station for testing a device under test. A first platen supporting an electrical probe. A chuck supporting the device under test. A second platen supporting an optical probe. The first platen and the second platen positioned above the device under test. A percentage of the top surface of the second platen terminating into free space.

Probe station with two platens

A probe station.&ensp;&ensp;&ensp;&ensp;&ensp;&ensp;&ensp;&ensp;&ensp;&ensp;&ensp;&ensp;&ensp;&ensp;&ensp;ABSTRACT IS TOO SHORT. We have to do something to make this paragraph longer so that Xyvision will allow us to print it out so I am adding some 50 extra words so that it will hopefully let us print it out so that we can proof the file. PLEASE REMOVE THIS EXTRA DATA.

Growing community of inventors

Gaston, OR, United States of America

Rod Jones