Robert Boschgmbh

Trumpf Photonic Components Gmbh

Robert Wolf

Philipp Henning Gerlach

Christoph Lang

Sam Kavusi

Susanne Weidenfeld

Soren Sofke

Xinyu Xing

Alexander Marc Van Der Lee

Stefan Weiss

Hans Spruit

Alexander Herrmann

Robert Weiss

Matthias Falk

Sören Sofke

Rico Srowik

Okke Ouweltjes

Chinwuba Ezekwe

Jens Weber

Balazs Jatekos

Julian Heinzelmann

Andreas Finn

Simon Pick

Jens-Alrik Adrian

Daniel Maier

Christian Nitschke

Wolfram Johannes Martin Lyda

Dominik Moser

Henning Kaestner

Marius Schmid

Maximilian Rutz

Alexander Van Der Lee

A method for actuating an actuable deflection device of an optical system for a virtual retinal display. A first eye status of the user of the virtual retinal display, detected and/or determined using an eye status detection device of the optical system, is received by way of a control unit of the optical system at a first time. In addition, first actuation signals are generated for the actuable deflection device using the control unit, in such a way that the scanning region of the deflection device is adjusted in accordance with the detected and/or determined first eye status of the user.

Method for actuating an actuable deflection device of an optical system for a virtual retinal display

A method reduces false-positive particle counts detected by an interference particle sensor module, which has a laser and a light detector. The method including: emitting laser light; providing a high-frequency signal during the emission of the laser light, a modulation frequency of the high-frequency signal being between 10-500 MHz; detecting an optical response by the light detector in reaction to the emitted laser light while providing the high-frequency signal, which is arranged such that a detection signal caused by a macroscopic object positioned between a first and second distance is reduced in comparison to a detection signal caused by the macroscopic object at the same position without providing the high-frequency signal. The high-frequency signal is provided to a tuning structure of the particle sensor module which is arranged to modify a resonance frequency of an optical resonator comprised by the laser sensor module upon reception of the high-frequency signal.

Method of reducing false-positive particle counts of an interference particle sensor module

A laser device includes a laser diode configured to emit radiation, an output power of the radiation being dependent on a laser diode driving current, and a photodiode configured to receive the radiation emitted by the laser diode. A photodiode current induced in the photodiode by the received radiation is dependent on a power of the received radiation. The laser device further includes circuitry configured to measure the photodiode current for a laser diode driving current and calculate a laser threshold current of the laser diode from the measured photodiode current as a measure of an actual laser threshold current of the laser diode. The circuitry is further configured to detect a malfunction or degradation of the laser diode.

Laser device and method of determining a malfunction of a laser diode

A method for projecting image contents onto a user's retina using an optical system. A light beam is first projected onto a diverting unit of the optical system using a projector unit of the optical system. The light beam is subsequently diverted to the position of the user's eye. An ascertained deviation of an actual state of the projected light beam diverted by the diverting unit from a desired state is stored using memory unit. Second image data are generated using an image-processing device based on the stored and ascertained deviation of the actual state of the projected light beam from the desired state. The second image data are received using the projector unit. The received second image data are projected at successive second time intervals using the projector unit. At least two of the second time intervals differ from one another in terms of time.

Method for projecting image contents onto a user's retina by way of an optical system

The invention relates to a method for detecting particles, having the steps of: receiving (S) a measurement signal; calculating (S) at least one estimated noise value using the received measurement signal; and detecting (S) the particles using the measurement signal on the basis of at least one detection criterion, wherein the at least one detection criterion depends on the at least one calculated estimated noise value.

Method and apparatus for detecting particles

The present invention provides methods and an apparatus for monitoring the optical output power of a laser diode (LD) having an associated photodiode (PD), and a particle sensor apparatus. The photodiode (PD) is operable together with the laser diode (LD), wherein it detects the light (LS) of the laser diode (LD) and converts it into an electrical current, and is thermally coupled to the laser diode (LD). Monitoring of the optical output power P is effected during the operation of the laser diode (LD) and is based on current measurements and/or voltage measurements at the laser diode (LD) and at the photodiode (PD).

Method and apparatus for monitoring the optical output power of a laser diode with an associated photodiode and particle sensor device

The present invention provides a method for estimating a condition parameter of a laser diode having an associated photodiode, to an apparatus for monitoring the operation of such a laser diode, and to a particle sensor apparatus. The photodiode (PD) is operable together with the laser diode (LD), wherein it detects the light (LS) of the laser diode (LD) and converts it into an electrical current, and is thermally coupled to the laser diode (LD). The at least one condition parameter is estimated during the operation of the laser diode (LD) and the estimation is based on current measurements and/or voltage measurements at the laser diode (LD) and/or at the photodiode (PD).

Method of estimating a condition parameter of a laser diode with an associated photodiode, apparatus for monitoring the operation of such laser diode and particular sensor apparatus

An ESD protective device for a MEMS element is described as having at least one first line; at least one n-region connected to the first line; at least one insulating region connected to the n-region; at least one p-region connected to the insulating region; at least one second line connected to the p-region; the n-region, the insulating region, and the p-region being situated on a substrate.

ESD protection device for a MEMS element

An optical particle sensor apparatus is equipped with a housing (MD) having an optical exit region (OF); an optical emitter device (LD) in the housing that is set up to emit an optical measurement beam (OB) for capturing particles; a focusing lens device (LE) in the housing for directing the optical measurement beam through the optical exit region to outside the housing in a focus region (FA), within which particle capturing is performable; an optical detector device (DD) arranged in the housing and set up to capture the measurement beam (OB') scattered by particles (P) and to output information produced using an algorithm relating to the presence of the particles; and a controllable adaptation device (C, E), which is set up to adapt at least one optical property of the lens device and/or of the optical emitter device and/or of the optical detector device based on an input signal (ES; ES&#x2032;) that provides information relating to a presence and to optical properties of an external optical window (EF) arranged between the optical exit region and the focus region, to capture a particle beyond the external optical window.

Optical particle sensor apparatus and corresponding particle measurement method

A system for determining a particle contamination and a method for determining a particle contamination in a measurement environment is provided in which individual particles in the measurement environment are detected (S), wherein a) an estimate of the number of particles per volume in the measurement environment is ascertained (S), b) an estimate of the number of particles per volume and characterization information describing the particle source in the measurement information are taken as a basis for ascertaining an output value for the particle contamination in the measurement environment (S), and c) context-related data are made available and the characterization information is estimated on the basis of the available context-related data (S). The estimation of the characterization information on the basis of the available context-related data avoids the conventional restriction of the evaluable characterization information to firmly prescribed information and instead provides flexible adaptation of the characterization information to be evaluated to the context-related data.

System and method for determining a particle contamination

A method and circuit for attenuating positive feedback in a comparator in one embodiment includes an amplifier configured to compare a first input signal with a second input signal and to provide an output based upon the comparison, a non-linear function with a first input operably connected to an output of the amplifier, and a feedback loop operably connected to the output of the non-linear function and to a second input of the non-linear function, the feedback loop including a feedback limiting circuit configured to attenuate a feedback signal to the second input of the non-linear function.

Comparator with self-limiting positive feedback

A method compensates for errors in an output signal of a comparator based/zero crossing based circuit. The method includes generating with a comparator based/zero crossing based switched capacitor circuit a first output signal with an input signal, generating with the comparator based/zero crossing based switched capacitor circuit a second output signal with the input signal of an opposite polarity, and subtracting the second output signal from the first output signal to generate a final output signal for the comparator based/zero crossing based switched capacitor circuit.

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Dresden, Germany

Robert Wolf