Intelligent Reasoning Systems, Inc.

Robert W Tait

Mark R DeYong

Alvaro D Lewin

An illumination system for inspection of devices is disclosed. The system includes a frame for positioning over an image area. A plurality of light source groups are coupled with the frame and are each configured to produce one or more wavelengths of light. Each light source group is configured to produce a wavelength of light which is not produced by another light source group.

Multi-angle inspection of manufactured products

An illumination system and method for providing wide angle illumination to objects to be inspected. The illumination system includes a dome light array having a plurality of rows where each row includes a plurality of lamps arranged in an arc about an imaging area (so that each lamp in the row is approximately the same distance from the imaging area) and all of the lamps in a row point to and illuminate the same point within the image area. The illumination system can include an aperture in the top of the dome light array through which a camera can image the object. Positioning each row of lamps in an arc about the image point provides various illumination angles to give a relatively uniform wide angle, yet intense, illumination to enhance automated PWB defect inspection. To further provide illumination, a pair of side panel light arrays having a plurality of lamps can be attached to the sides of the dome light array so that the side lamps provide further vertical illumination on the image area from a horizontal side plane.

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Brighton, MI, United States of America

Robert W Tait