Verigy (singapore) Pte. Ltd.

Agilent Technologies, Inc.

Verigy Pte. Ltd.

Robert Stanley Kolman

Reid F Hayhow

Daven Walt Septon

In one embodiment, a method for determining which of two computer processes should perform a function X includes the following actions. If a second computer process is dependent on data received at a first computer process, it is determined whether the second computer process currently requires the data. If the second computer does not currently require the data, it is determined whether 1) a cost of the second computer process performing a function X on the data, plus 2) a cost of transmitting the data to the second computer process, exceeds 3) a cost of the first computer process performing the function X on the data. If the first two costs exceed the latter, the function X is caused to be performed by the first computer process.

Method and apparatus for determining which of two computer processes should perform a function X

In one embodiment, a method of has the steps of A) accessing a stream of test data comprising 1) a number of state events and 2) a number of data events interspersed with the ones of the state events; B) upon accessing one of the data events, determining if the data event is in conformity with the current test state; C) if not, 1) buffering a number of additional data events; and 2) if the number of additional data events imply that a state event should have been received and a state change should have occurred, prior to accessing the data event, i) synthesizing and publishing the state event that should have been received, in conformity with the implied state change; ii) updating the current test state; and iii) then, publishing the data event.

Systems, methods and apparatus for synthesizing state events for a test data stream

In one embodiment, and in response to an ordered sequence of events corresponding to execution of a plurality of tests on at least one device under test (DUT), 1) a plurality of data objects are created, the data objects including A) some data objects that correspond to logical groupings of test results implied by ones of the events, and B) a generic data object that corresponds to a user-defined one of the events; 2) ones of the data objects are related to others of the data objects in a hierarchical tree structure, with the generic data object being related to others of the data objects based on the position of the user-defined event in the ordered sequence of events; and 3) data corresponding to ones of the events is related to ones of the data objects in the hierarchical tree structure. A number of data formatters are provided access to the plurality of data objects and data associated with the hierarchical tree structure. Other embodiments are also disclosed.

Method and apparatus for handling a user-defined event that is generated during test of a device

In a method for assigning test numbers, current testflow context information is maintained during execution of a testflow. Upon execution of a subtest in the testflow, a database of test numbers is indexed using index information comprising 1) an identifier of the subtest, and 2) the current testflow context information. If a test number corresponding to the index information exists in the database, the test number is assigned to a result of the subtest. If a test number corresponding to the index information does not exist in the database, a new test number is assigned to the result of the subtest, and the index information and new test number are associated in the database. A test number engine for satisfying calls for test numbers is also disclosed.

Method and apparatus for assigning test numbers

The present invention eliminates the indexing time of an SOC tester, or at least reduces it to the time delay for an electronic switch to toggle or a mechanical shift to occur between two banks of DUTs to be tested on a DUT load board mounted on a test head.

Method and apparatus for eliminating automated testing equipment index time

In a method for assigning test numbers, current testflow context information is maintained during the execution of a testflow. If one or more test number factors have been specified for one or more levels of the current testflow context, the test number factors are used to determine a base number for a current test number range. Otherwise, the base number is set to a default base number. Upon execution of a subtest in the testflow, a result of the subtest is assigned a next test number in the current test number range. The following items are then associated in a test number database: 1) an identifier of the subtest, 2) the current testflow context information, 3) the test number, and 4) the base number. When stored in the database, the base number serves as a specification number for its corresponding test number. Also disclosed are other methods and apparatus that use contextual test number factors to assign test numbers.

Methods and apparatus that use contextual test number factors to assign test numbers

A rotatable or translatable carousel configured to facilitate electrical or electronic testing of Devices Under Test (DUTs) in combination with an insertion handler and a test head is disclosed. The carousel is configured to be placed on a test head of a tester in a first position with a first Device under Test (DUT) (such as a system-on-a-chip (SOC) integrated circuit (IC)) loaded in a first test position of the carousel. A first electrical or electronic test is performed on the first DUT at the first position, after which the carousel is advanced to a second position and a second DUT is loaded in a second test position of the carousel. While the carousel is positioned at the second position, the first test is performed on the second DUT and a second electrical or electronic test is performed on the first DUT. In one embodiment, the process of testing DUTs, inserting DUTs and rotating or translating the carousel in respect of the test head is repeated until all test positions in the carousel have been filled and all desired electrical or electrical tests have been performed on the first DUT. At this point the process of removing fully-tested DUTs from the carousel is optimally undertaken.

Carousel device, system and method for electronic circuit tester

Methods and systems for controlling device testing are disclosed. In one embodiment, the system comprises a local controller having a slave mode and a control mode, when in the control mode, the local controller to control testing of a device and to initiate one or more test instructions to be applied to the device, and when in the slave mode, to pass through a remote test instruction received from a remote controller to a tester. The system further comprises the tester, communicatively coupled to the local controller, to apply one of the one or more test instructions and the remote test instruction to the device.

Device testing control

In a method for assigning test numbers, current testflow context information is maintained during execution of a testflow. The information is maintained as an array of one or more context values. Upon execution of a subtest in the testflow, a map of linked data nodes is indexed using a key formed from 1) a numeric identifier of the subtest, and 2) the array of context values. If a data node corresponding to the key exists in the map and is associated with a test number, the data node's test number is assigned to a result of the subtest; else, a new test number is assigned to the result of the subtest, and the new test number is associated with a data node that is linked in the map. A test number database, and a test number engine for satisfying calls for test numbers, are also disclosed.

Method, apparatus and database using a map of linked data nodes for storing test numbers

A graphical user interface (GUI) of a report format editor for circuit test displays a number of user-selectable representations of circuit test data. The GUI also displays a user-modifiable ASCII report format that is formed, at least in part, of placed ones of the user-selectable representations of circuit test data. Program code interprets the relative sizes and placements of elements forming the user-modifiable ASCII report format, and generates an ASCII format description file in response to the interpretation. A circuit test system then formats circuit test data in accordance with the ASCII format description file.

Report format editor for circuit test

Apparatus for handling test number collisions comprises program code stored on computer readable media. The code, in response to a collision between first and second test numbers, automatically adjusts the second test number in response to a collision tracking value associated with the first test number, thereby eliminating the collision. Also in response to the collision, the code updates the collision tracking value. Other methods and apparatus for handling test number collisions are also disclosed.

Methods and apparatus for handling test number collisions

A method, a system and/or a computer readable medium for accessing design data including an electronic image of an integrated circuit to be tested; determining whether a pin of the integrated circuit has been assigned to a port in a multi-port automated test environment; enabling a displayable pin indicator based in part upon the determination of whether a pin is assigned to a port; and displaying the electronic image and the displayable pin indicator.

Method and system for graphical pin assignment and/or verification

In a method for assigning test numbers, current testflow context information is maintained during the execution of a testflow. Upon generation of a new test number for a result of a subtest in the testflow, a database of test numbers is indexed using the new test number. If the new test number appears as an entry in the database, a unique identifier associated with the entry is compared to index information comprising 1) an identifier of the subtest, and 2) the current testflow context information. If the unique identifier does not match the index information, a test number collision is identified. Otherwise, the new test number is assigned to the subtest. Other methods and apparatus for identifying test number collisions are also disclosed.

Methods and apparatus for identifying test number collisions

A dynamic waveform manager and an application policy are provided to an electronic device that executes an application requiring the use of waveforms accessed from a waveform table characterized by a limited number of entries. The application policy contains waveform sequencing information specific to the application. The application may utilize any number of waveforms that are typically stored in a memory separate from the waveform table. The dynamic waveform manager monitors the execution of the application, and manages loading and unloading of waveforms required by the application into and out of the waveform table such that each waveform required by the application is loaded in the waveform prior to and at least by the time it is needed by the application. The dynamic waveform manager accesses the application policy to reference the waveform sequencing information specific to the application for use in determining when and which waveforms to load and unload to and from the waveform table.

Growing community of inventors

Longmont, CO, United States of America

Robert Stanley Kolman