Leland Stanford Junior University

Robert Sinclair

Bruce M Lairson

Mark R Visokay

Gerardo A Bertero

A [(Pt/Co/Pt)/Pd] multilayer thin film (40) provides improved perpendicular anisotropy and magnetic coercivity relative to Pt/Co multilayer thin films (10) without reducing the Kerr rotations provided by the component Pt/Co layers (44, 48, 46). [(Pt/Co/Pt)/Pd] multilayer thin films (40) comprise a substrate (26), an optional underlayer (110) including a crystallographically textured layer (114) of Pt and a crystallographically textured layer (116) of Pd, and several quadlayers (42) of Pt, Co, and Pd forming a periodic array (43) in the direction of the normal to the substrate (26). Each quadlayer (42) of the periodic array (43) typically comprises a first layer (44) of Pt atoms approximately one to two atomic monolayers thick, a layer (46) of Co between one and three atomic monolayers thick, a second layer (48) of Pt of substantially the same thickness as the first layer (44) of Pt, and a layer (50) of Pd that is at least as thick as the Pt layers.

Multilayered thin films for perpendicular magnetic recording

A method for making oriented thin films of a ternary intermetallic compound and such films having a tetragonal structure and generally uniaxial magnetic, optical, electronic, and mechanical properties, as well as a generally lower Curie temperature than oriented binary intermetallic films. The steps of the method involve selecting a substrate material for biasing the orientation of the ternary intermetallic compound and exhibiting no chemical reactiveness to the ternary intermetallic compound. Preferably, such substrate is a single crystal, such as MgO or Al.sub.2 O.sub.3, or an amorphous material such as pure SiO.sub.2, amorphous carbon, or glass. In a second step the substrate is heated to a temperature above 450.degree. C. and then, a first metal, a second metal, and a third metal are simultaneously deposited on the substrate material. The first metal and second metal are selected from among metals pairs including CoNi, CoFe, FeNi, and the third metal is selected from the group of metals consisting of Pd and Pt. The thin film formed is a ternary intermetallic compound exhibiting an L1.sub.0 crystal structure and the desired uniaxial properties. The method of the invention allows one to accurately control the relative amounts of the three metals.

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Palo Alto, CA, United States of America

Robert Sinclair