Northrop Grumman Systems Corporation

Robert Silberstein

John Douglas Weir

Stanley M Reich

Theodore W Hilgeman

Donald DiMarzio

Don DiMarzio

Steven Chu

The present invention relates to a system for imaging the surface of a substrate through a coating on the substrate. The system includes an infrared light source positioned to cast an infrared light upon the substrate to thereby create reflected light. A focal plane array may be positioned to receive the reflected light and generate an image therefrom. At least one optical filter may be disposed between the substrate and the focal plane array so as to pass only coating transparent wavelengths of the reflected light along an optical path between the infrared light source and the focal plane array thereby visually revealing irregular structural features of the substrate as at least one image.

System and method for imaging of coated substrates

A system is disclosed which utilizes the substantially steady-state temperature of a coated object, in conjunction with an optical detection system, to selectively view defects and features of the object below the coating without the necessity of transient heating or IR illumination and reflectance imaging. The optical detector, such as an IR camera, may be tailored for the wavelengths at which the coating material is substantially transparent, thereby maximizing the viewing clarity of the defects and features under the coating, and distinguishing them from any spurious features on the top surface of the coating. The present system enables the inspection of small or large areas in real time, without requiring complex image acquisition, storage and image processing equipment and software.

System for detecting structural defects and features utilizing blackbody self-illumination

According to one embodiment of the invention, a method for locating a source of a signal includes detecting, at a plurality of locations, a near-field signal. The method also includes processing the near-field signal. The method further includes locating a source for the near-field signal based on the processed near-field signal detected at a plurality of locations.

Growing community of inventors

New York, NY, United States of America

Robert Silberstein