Trinamix Gmbh

Basf Se Corporation

Max-planck-gesellschaft Zur Forderung Der Wissenschaften E.v.

Other

Richard Wolf Gmbh

03;basf Se

Robert Send

Ingmar Bruder

Sebastian Valouch

Erwin Thiel

Stephan Irle

Patrick Schindler

Michael Eberspach

Peter Schillen

Christian Lennartz

Wilfried Hermes

Henrike Wonneberger

Celal Mohan Oeguen

Robert Gust

Bertram Feuerstein

Christoph Lungenschmied

Sorin Ivanovici

Gerhard Wagenblast

Klaus Muellen

Martin Koenemann

Christian Bonsignore

Lars Diesselberg

Christian Schildknecht

Chen Li

Peter Fejes

Gerardus De Keyzer

Friedrich Schick

Peter Erk

Glauco Battagliarin

Neil Gregory Pschirer

Flavio Luiz Benedito

Helmut Reichelt

Ruediger Sens

Vytautas Getautis

Junichi Tanabe

Hitoshi Yamato

Christian Eickhoff

Maryte Daskeviciene

Hiroshi Yamamoto

Ingolf Hennig

Tadas Malinauskas

Daniel Kaelblein

Yuichi Nishimae

Benjamin Rein

Rüdiger Sens

Heiko Hengen

Stefan Hengen

Thomas Ohmer

Sebastian Mueller

Jakob Unger

Regina Hoeh

Fabian Dittmann

Heidi Bechtel

Timo Altenbeck

Thomas Hupfauer

Andre Schmidt

Christopher Hahne

Bernd Scherwath

Anke Handreck

Peter Paul Kaletta

Gabriele Mattern

Simone Christina Spiller

Hannah Stephanie Mangold

Martin Könemann

Michel Pepers

Long Chen

Matthias Müller

Gerd Weber

Ryuichi Takahashi

Yulian Zagranyarski

Shinji Nakamichi

Sheeja Bahulayan

Darren Richard Gould

Sudhakar Sundarraj

Matthias Mueller

Florian Schluetter

Celal Mohan Deguen

Alexander Klein

Svetlana Guriyanova

Hubert Waindok

Simona Urnikaite

Nils Berner

Stefan Klueh

Bernd Neurohr

Stefan Hoos

Oili Pekkola

Artem Nikolaevich Skabeev

Edgar Matevosjan

Milan Kivala

Stefan Metz

Celal Mohan ÖGÜN

Described herein is a detector for determining a position of at least one object. The detector includes at least one sensor element having a matrix of optical sensors, the optical sensors each having a light-sensitive area, wherein the sensor element is configured to determine a reflection image of the object. The detector also includes an evaluation device configured to select a reflection feature of the reflection image, and determine a distance estimate of the selected reflection feature of the reflection image by optimizing at least one blurring function fa, wherein the distance estimate is given by a longitudinal coordinate z and an error interval±ε. The evaluation device is adapted to determine at least one displacement region in at least one reference image corresponding to the distance estimate, and to match the selected reflection feature with at least one reference feature within the displacement region.

Detector for determining a position of at least one object

Described herein are systems including a structured light projector, a semiconductor detector, and a processor. Also described herein is a non-transitory computer readable medium storing executable instructions. The systems and non-transitory computer readable medium are configured to output a signal including information related to the classification of an object.

Detector for identifying at least one material property

Described herein is an optical sensor, a detector for an optical detection including the optical sensor, a method for manufacturing the optical sensor and various uses of the optical detector. The optical sensor includes a stack.

Method for selecting an optical sensor

Described herein is a detector for identifying at least one material property m. The detector includes at least one sensor element including a matrix of optical sensors, the optical sensors each having a light-sensitive area. The sensor element is configured for recording at least one reflection image of a light beam originating from at least one object. The detector includes at least one evaluation device configured for determining the material property m by evaluation of at least one beam profile of the reflection image and evaluation of a material feature φ2m.

Described herein is a detector for identifying at least one material property m. The detector includes at least one sensor element including a matrix of optical sensors, the optical sensors each having a light-sensitive area. The sensor element is configured for recording at least one reflection image of a light beam originating from at least one object. The detector includes at least one evaluation device configured for determining the material property m by evaluation of at least one beam profile of the reflection image and evaluation of a material feature ϕ2m.

Described herein is a spectrometer device. The spectrometer device is configured for determining at least one spectral or spectroscopic information of at least one object. The spectrometer device is configured for determining intensities of constituent wavelength signals of at least one light beam propagating from the object to the spectrometer device. The spectrometer device includes at least one distance detector configured for determining at least one distance information about a distance between at least one object and the spectrometer device, at least one pixelated imaging detector configured for determining at least one image of the object, and at least one evaluation device configured for determining at least one material information of the object by evaluating of at least one image of the object determined by the pixelated imaging detector. The evaluation device is configured for performing at least one spectroscopic analysis of the determined intensities of constituent wavelength signals.

Spectrometer device

Described herein is a detector for determining a position of at least one object. The detector includes:

Described herein is an optical sensor, a detector including the optical sensor for an optical detection of at least one object, a method for manufacturing the optical sensor and various uses of the optical detector. The optical sensor can be supplied as a non-bulky hermetic package which provides an increased degree of protection against possible degradation by humidity and/or oxygen over long terms. Further, the optical sensor may be easily manufactured and integrated on a circuit carrier device.

Optical sensor and detector for an optical detection

A medical apparatus having an application device which can be brought into contact with a patient to be treated, and a galvanic isolator which can be connected to the application device, the isolator having at least one application connector for connection to the application device and at least one supply connector for connection to a device. The isolator is configured to galvanically isolate the application connector from the supply connector. The isolator has at least one first radio unit connected to the application connector, and at least one second radio unit connected to the supply connector. The first antenna and second antenna are fixed on a carrier at a visible distance from each other. The at least one first radio unit and the at least one second radio unit are configured to transmit signals and/or data between the application connector and the supply connector.

Medical apparatus with galvanic isolator

Photoconductor readout circuit

Described herein is a spectrometer device for optical analysis of at least one sample. The spectrometer device includes:

Spectrometer device for optical analysis of at least one sample

Described herein is a projector for illuminating at least one object with at least two illumination patterns. The projector includes at least one tunable laser source and at least one diffractive optical element. The projector is configured to generate the at least two illumination patterns each including a plurality of illumination features by controlling at least one property of the tunable laser source. The projector includes at least one control unit. The control unit is configured for controlling the at least one property of the tunable laser source.

Detector with a projector for illuminating at least one object

A device includes at least one array of photoconductors, at least one bias voltage source, and at least one photoconductor readout circuit. Each photoconductor is configured for exhibiting an electrical resistance dependent on an illumination of its light-sensitive region, and at least one photoconductor of the array is designed as characterizing photoconductor. The bias voltage source is configured for applying at least one alternating bias voltage to the characterizing photoconductor or at least one direct current (DC) bias voltage to the characterizing photoconductor. The photoconductor readout circuit is configured for determining of a response voltage of the characterizing photoconductor generated in response to the bias voltage. The response voltage is proportional to a variable characterizing the array of photoconductors. The photoconductor readout circuit configured for determining of the response voltage of the characterizing photoconductor during operation of the array of photoconductors.

Photoconductor readout device and method of using same for determining responsivity and detectivity

Described herein is a detector for detecting optical radiation, especially within the infrared spectral range, specifically with regard to sensing at least one of transmissivity, absorption, emission and reflectivity, being capable of avoiding or diminishing a cross detection between sensor areas, specifically between adjacent sensor areas, thus, avoiding or diminishing a deterioration of a measurement based on the at least one sensor signal.

Optical detector

Described herein is a detector for identifying at least one material property m. The detector includes at least one sensor element including a matrix of optical sensors, the optical sensors each having a light-sensitive area. The sensor element is configured for recording at least one reflection image of a light beam originating from at least one object. The detector includes at least one evaluation device configured for determining the material property by evaluation of at least one beam profile of the reflection image.

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Karlsruhe, Germany

Robert Send