Digital Optics Corporation

Robert Russell Boye

James E Morris

Michael R Feldman

Alan D Kathman

Hongtao Han

Robert Te Kolste

Thomas J Suleski

Jay Mathews

William F Delaney

Alvaro A Cruz-Cabrera

Harris Miller

Eric Schwartz

A wavelength detector includes an optical structure receiving an input beam, the optical structure outputting at least two wavelength dependent two-beam interference signals. Each wavelength dependent two-beam interference signal has a different phase offset. A detector receives the at least two wavelength dependent two-beam interference signals and outputs an electrical signal representative of each wavelength dependent two-beam interference. A processor receives the at least two electrical signals from the detector and generates a composite control signal. The two-beam interference signals may be created by reflecting light off the two surfaces of the optical structure. The different phase offsets may be created by providing a stepped pattern on one of the surfaces of the optical structure. Phase shifting interferometry techniques may be used to determine the wavelength from the periodic signals.

Non-etalon reflective wavelength locking optical sub-assembly and associated methods

A passive optical element is transferred into a substrate already having features with a vertical dimension thereon. The features may be another passive optical element, an active optical element, a dichroic layer, a dielectric layer, alignment features, metal portions. A protective layer is provided over the feature during the transfer of the optical element. One or more of these processes may be performed on a wafer level.

Transfer of optical element patterns on a same side of a substrate already having a feature thereon

A wavelength detector includes a beam splitter block that taps off two spatially separated beams and a linear filter in an optical path of one of the two beams. The linear filter may be provided on the beam splitter block. The linear filter may be a notch anti-reflective filter in the optical path of the application beam. One or both of the beams may be focused on to their respective detectors.

Linear filter based wavelength locking optical sub-assembly and associated methods

A wavelength detector includes an optical structure receiving an input beam, the optical structure outputting at least three wavelength dependent two-beam interference signals. Each wavelength dependent two-beam interference signal has a different phase offset. A detector receives the at least three wavelength dependent two-beam interference signals and outputs an electrical signal representative of each wavelength dependent two-beam interference. A processor receives the at least three electrical signals from the detector and generates a composite control signal. Alternatively, two of the three signals are periodic with respect to wavelength and the third signal is a reference signal. The two-beam interference signals may be created by providing patterned apertures in respective beam paths. Phase shifting interferometry techniques may be used to determine the wavelength from the periodic signals.

Non-etalon wavelength locking optical sub-assembly and associated methods

An integrated optical coupler includes multiple ports and a beam discriminating element. Optical elements are provided for directing light to and from the ports and the beam discriminating element. These optical elements may include two optical elements created on the same surface of a substrate. All of the optical elements needed for directing the light may be formed on a transparent substrate or on a structure in the optical path bonded to the substrate. The optical elements may output light of the different wavelengths at the same angle or may be dispersive. The beam discriminating element may discriminate on the basis of wavelength or polarization.

Growing community of inventors

Charlotte, NC, United States of America

Robert Russell Boye