Halliburton Energy Services, Inc.

Medical University of South Carolina

Landmark Graphics Corporation

Ometric Corporation

Robert Paul Freese

David L Perkins

Christopher Michael Jones

William Joseph Soltmann

Michael Thomas Pelletier

Michael L Myrick

Michael Neil Simcock

John C Blackburn

Ola Tunheim

James Robert MacLennan

Richard Neal Gardner

Ryan J Priore

Shilin Chen

Jonathan H James

Gary Eugene Weaver

Rory Dennis Daussin

Johanna Haggstrom

Laurence James Abney

David Michael Loveless

Alexis Wachtel, Ii

Kristin Katherine Holden

Leonard Zheleznyak

Samuel James Maguire-Boyle

Terrell K Teague

Thomas Idland

Aaron Gene Russell

Robert Douglas Hayworth

Marshall E Webster

Ronald Glen Dusterhoft

Etienne M Samson

James Martin Price

Amit Kumar

Tasneem Mandviwala

Aditya B Nayak

Kenneth E Williams

John Gilbert Heaton

Tian He

Nitika Kalia

Paul Robert Terry

Luisa T M Profeta

Tim Tips

Matt Scogin

Tasneem A Mandviwala

William J Soltmann

A system can include a filter assembly with a filter and a substance in the filter assembly, and at least one optical computing device having an integrated computational element which receives electromagnetic radiation from the substance. A method can include receiving electromagnetic radiation from a substance in a filter assembly, the electromagnetic radiation from the substance being received by at least one optical computing device having an integrated computational element, and the receiving being performed while a filter is positioned in the filter assembly. A detector may receive electromagnetic radiation from the integrated computational element and produce an output correlated to a characteristic of the substance. A mitigation technique may be selected, based on the detector output.

In situ evaluation of filter parameters with opticoanalytical devices

A design of an integrated computational element (ICE) includes specification of a substrate and a plurality of layers, their respective constitutive materials, target thicknesses and refractive indices, where refractive indices of respective materials of adjacent layers are different from each other, and a notional ICE fabricated in accordance with the ICE design is related to a characteristic of a sample. One or more layers of the plurality of layers of an ICE are formed based on the ICE design, such that the formed layer(s) includes(e) corresponding material(s) from among the specified constitutive materials of the ICE. Characteristics of probe-light interacted with the formed layer(s) are measured at two or more temperatures. Temperature dependence(ies) of one or more refractive indices of the corresponding material(s) of the formed layers is(are) determined using the measured characteristics. The received ICE design is updated based on the determined temperature dependence(ies) of the refractive index(ices).

Determining temperature dependence of complex refractive indices of layer materials during fabrication of integrated computational elements

A system includes a computational system to receive a design of an integrated computational element (ICE) including specification of substrate and layers. Additionally, the system includes a deposition source to provide a deposition plume having a plume spatial profile, and a support having a cylindrical surface. The cylindrical surface of the support is spaced apart from the deposition source and has a shape that corresponds to the plume spatial profile in a particular cross-section orthogonal to a longitudinal axis of the cylindrical surface of the support, such that, when the substrate support, with the supported instances of the substrate distributed over the cylindrical surface of the substrate support, is translated relative to the deposition plume along the longitudinal axis of the cylindrical surface of the substrate support, thicknesses of instances of each of the deposited layers are substantially uniform across the plurality of instances of the ICE.

Fabrication of integrated computational elements using cylindrical substrate support shaped to match a cross-section of a spatial profile of a deposition plume

An optical computing device adapted to compensate for the effects of detector thermal drift. A thermal drift compensation circuit is provided to drive up the optical detector gain as the temperature increases.

Thermal drift compensation in optical computing devices

Disclosed is the detection of emulsions and microdispersions with an optical computing device. One disclosed method includes emitting electromagnetic radiation from an electromagnetic radiation source, optically interacting the electromagnetic radiation with a fluid and thereby generating fluid interacted radiation, detecting a portion of the fluid interacted radiation with a reference detector arranged within an optical channel of an optical computing device, generating a reference signal with the reference detector, and determining an emulsive state of the fluid based on the reference signal.

Emulsion detection using optical computing devices

A design of an integrated computational element (ICE) includes (1) specification of a substrate and multiple layers, their respective target thicknesses and refractive indices, refractive indices of adjacent layers being different from each other, and a notional ICE fabricated based on the ICE design being related to a characteristic of a sample, and (2) identification of one or more critical layers of the ICE layers, an ICE layer being identified as a critical layer if potential variations of its thickness or refractive index due to expected fabrication variations cause ICE performance degradation that exceeds a threshold degradation, otherwise the ICE layer being identified as a non-critical layer. At least one critical layer of the ICE is formed using two or more forming steps to form respective two or more sub-layers of the critical layer, and at least one non-critical layer of the ICE is formed using a single forming step.

Fabrication of critical layers of integrated computational elements

The disclosed embodiments include a system and method for manufacturing an integrated computational element (ICE) core. In one embodiment, the method comprises thermally evaporating a material to deposit the material on a substrate, wherein the material is deposited to establish a shape of the ICE core. The shape of the ICE core defines transmission, reflection, and absorptive electromagnetic intensity as a function of wavelength of the ICE core. In one embodiment, the method includes varying e-beam or ion-beam intensities and strengths to control the shape of the ICE core.

System and method for deposition of integrated computational elements (ICE) using a translation stage

The disclosed embodiments include a system and method for manufacturing an integrated computational element (ICE) core. The method comprises varying a distance between a thermal component relative to a substrate holder that holds at least one substrate during a thin film deposition process to improve uniformity of the ICE core. In one embodiment, varying the distance between the thermal component relative to the substrate holder that holds at least one substrate includes moving at least a portion of the substrate holder in at least one direction relative to the thermal component and also moving the thermal component in at least one direction relative to the substrate holder during the thin film deposition process.

Deposition of integrated computational elements (ICE) using a translation stage

A method includes optically interacting a bulk material or powder stored in a storage bin with an integrated computational element ('ICE') configured to modify an electromagnetic radiation according to a characteristic of the bulk material or powder. The method also includes detecting the modified electromagnetic radiation with a detector, and producing an output signal correlated to a value for the characteristic of the bulk material or powder, and receiving and processing the output signal with a signal processor to yield a value for the characteristic of the bulk material or powder. Also, the method includes transmitting a message flagging the storage bin when it is determined that the bulk material or powder is not suitable for continued storage. The bulk material or powder includes a dry cement or a dry cement component.

Identification of material type and condition in a dry bulk material storage bin

In one embodiment, a downhole drilling tool configured to engage a formation to form a wellbore includes one or more channels formed in a bit body, the channels configured to direct electromagnetic radiation. The downhole drilling tool also includes an opto-analytical device integrated with the downhole drilling tool, the opto-analytical device configured to receive electromagnetic radiation directed through the one or more channels and detect a drilling characteristic based on the received electromagnetic radiation.

System and method for analyzing downhole drilling parameters using an opto-analytical device

A method includes optically interacting a flow of bulk material or powder in a pneumatic conveyor with an integrated computational element ('ICE') configured to modify an electromagnetic radiation according to a characteristic of the flow of bulk material or powder. The method includes detecting the modified electromagnetic radiation with a detector, producing an output signal corresponding to the characteristic of the flow, and receiving and processing the output signal with a signal processor to yield a value for the characteristic of the flow. Also, the method includes modifying at least one of a flow rate or an air pressure in the pneumatic conveyor in response to the value of the characteristic of the flow. The bulk material or powder includes a dry cement or a dry cement component.

Pneumatic conveying system and method using optical flow characterization data

In one embodiments, a method includes drilling a wellbore in a formation with a drilling tool. The method further includes receiving electromagnetic radiation using an opto-analytical device coupled to the drilling tool. The method also includes determining torsion associated with drilling the wellbore based on the received electromagnetic radiation.

System and method for determining torsion using an opto-analytical device

In one embodiment, a method includes drilling a wellbore in a formation with a drilling tool. The method further includes receiving electromagnetic radiation using an opto-analytical device coupled to the drilling tool. The method also includes determining a distance between a portion of the drilling tool and the formation based on the received electromagnetic radiation.

System and method for measuring gaps using an opto-analytical device

Growing community of inventors

Pittsboro, NC, United States of America

Robert Paul Freese