The Perkin-Elmer Corporation

Wentworth Laboratories Limited

Robert P Rising

Arthur Evans

Joseph R Baker

A test probe assembly for testing an integrated circuit (IC) device having contact pads deployed in a predetermined pattern in a common plane. The assembly includes a contactor formed by a flexible film of dielectric material having a rectangular planar central zone from whose corners extend radial slots to define suspension quadrants. Probe contacts formed on the undersurface of the central zone in a matching pattern are connected to probe terminals on the margins of the quadrants. The quadrants are marginally supported on corresponding branches of a mounting frame whereby the central zone sags below the frame which surrounds a central port in a printed circuit board, the port exposing the central zone to the IC device to be tested.

Test probe assembly for testing integrated circuit devices

A rotatable drum switches a vacuum source on and off towards an outermost bill in a stack to separate bills one at a time at high speeds from the stack and provide registration between the separate bills. As the bills are separated from the stack, means are provided to maintain a relatively constant pressure on the stack of bills. Flexible bands transport the separated bills away from the stack.

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Trumbull, CT, United States of America

Robert P Rising