Honeywell International Inc.

Robert P Costello

Barrett E Cole

Devices and methods for detecting particulate matter are described herein. One device includes a laser, a reflector, an ellipsoidal reflector, and a detector, wherein the laser is configured to emit a beam, the reflector is configured to reflect the beam toward the ellipsoidal reflector, and the ellipsoidal reflector has a first focal region located on a path of the reflected beam, and a second focal region located at a surface of the detector.

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Roseville, MN, United States of America

Robert P Costello