Beltronics Inc.

Texas Instruments Corporation

Other

Academy of Applied Science

Brookfield Engineering Laboratories, Inc.

Rudolph Technologies, Inc.

Image Recognition Technology, LLC

Eyedeal Scanning, LLC

Elemental Innovation Inc.

Velocity Image Processing LLC

Eydeal Scanning, LLC

Stella Alliance, LLC

Robert P Bishop

Michael T Sullivan

Timothy Pinkney

Richard Damon

Paul L Hainey

Peter G Berg

Justin D Bishop

Stanley J Lukasiewicz

Stephen B Offiler

Herman Purut

Keith W Kawate

Steven Beringhause

Vishwa N Shukla

Robert O Southworth

Douglas B Strott

David A Brookfield

Thomas J Charboneau

Allan J Siuzdak

Bryan J Dague

James A Salomon

Anthony J Sabetti

Jan Vijg

Robert Louis Bartosh

Teresa L McKim

Charles J Falzarano

Steve Auger

Zamir Jivani

Richard J Trottier

Robert E Luminello, Jr

John M Armacost

Richard J Balcarek

Krikor Bezjian

Derek Schwenke

Alex H Mak

Techniques for creating a three dimensional model of an object and eliminate artifacts due to changes in orientation of the object between successive scans. Such techniques may be applied to line scans and slice scans of an object.

Reconstruction of three dimensional model of an object compensating for object orientation changes between surface or slice scans

Methods and apparatus for inspection of electronic parts such as semiconductor wafers, high-density circuit boards, multi-layer substrates, chrome on glass masks, and other fine line products which compensates for reference misalignment. Conductor linewidth and space measurements are performed along the entire length of every conductor to sub-camera pixel, sub-micron accuracy in real time as the part is scanned. Billions of metrology measurements are also performed in real time to sub-micron accuracy. A self-learning automated method to extract measurement values from Computer Aided Design (CAD) files is described. This method automatically determines locations to perform these billons of operations within defined allowed manufacturing tolerances.

Compensating for reference misalignment during inspection of parts

A method and apparatus for optimizing inspection high-speed optical inspection of parts using intelligent image analysis to determine optimal focus using high numerical aperture (NA) optics, achieve a superior signal-to-noise ratio, resolution, and inspection speed performance with very limited depth of field lenses.

Focus adjustment for surface part inspection

A method and system for generating a three-dimensional model of a contact lens with a front and a back surface, in which the entire back surface consists of an array of independent data points shaped to conform to three-dimensional data provided by an ocular topographer. The sampling density is sufficiently high to characterize anomalies or injuries anywhere in the eye to optimize comfort and fit. The methods and systems also include modeling a scleral lens which rests either solely on the sclera, or straddles the limbus extending partially into the cornea is described. The resting surface conforms to the topology of the underlying ocular surface with topology guiding the design. Additional methods and systems model scleral lens optics without the use of trial lenses. The lens models can be used to machine or 3D print a lens that fits the patient. Such lenses benefit patients that suffer from dry eyes or whose eyes are not normally dry, but feel dry after wearing conventional contact lenses.

Topology guided ocular lens design

Techniques for creating a three dimensional model of an object and eliminate artifacts due to object motion. Such techniques are applied to line scans and slice scans of an object.

Reconstruction of three dimensional model of an object from surface or slice scans compensating for motion blur

Display screen with graphical user interface for a viscometer or rheometer

A method and apparatus for measuring the topography of the corneal and scleral regions of the eye. The measurements provide surface contours that are useful in the manufacture of scleral contact lenses.

Method and apparatus for determining eye topology

Scanning operation with concurrent focus and inspection

A method and apparatus for optimizing high-speed optical inspection of parts using intelligent image analysis to determine optimal focus using high numerical aperture (NA) optics, achieve a superior signal-to-noise ratio, resolution, and inspection speed performance with very limited depth of field lenses.

High speed autofocus system

A kitchen organizing system for tracking and rotating inventory, generating grocery lists, and suggesting and planning meals has a rotating base. The system has a generally hollow spherical housing located on a base top surface. With a bottom hemisphere front cover and a bottom hemisphere rear cover in place, the housing has a shape of a sphere. The housing has a microprocessor located inside. The housing has a power cord connected to the microprocessor. The housing has a display screen located at least partly in a housing top hemisphere on a housing front side connected to the microprocessor. The housing has a keyboard located on the housing bottom hemisphere front cover connected to the microprocessor. The housing has a printer located in the housing bottom hemisphere connected to the microprocessor. The housing has a scanner located in the housing top hemisphere in the rear side connected to the microprocessor.

Kitchen organizing system

A floating breakwater system comprises a plurality of modules that are flexibly affixed together. The modules are affixed together to make up a plurality of vertical panels made up of the modules and the vertical panels themselves are flexibly affixed together in generally parallel relationship. Each individual module has a front face that faces the oncoming wave. There are at least two inlets in the front surface and corresponding outlets in the rear surface and passageways between the inlets and the outlets such that the water propelled by the wave passes through the at least two passageways. Each passageway is tapered inwardly in the direction of the flow of the water and each passageway has a main longitudinal axis. The respective axes are angled inwardly toward each other and converge at a point displaced rearwardly from the outlets so that the water that passes through the passageways intersect at the point and the energy of the wave is dissipated.

Floating breakwater system and method for dissipating wave energy

The method for optimizing inspection speed during optical inspection of parts in high, low and fluorescent light applications. There are described autofocus mechanisms and methods optimized for fluorescent and non-fluorescent applications that when combined with a high speed CCD camera and high numerical aperture (NA) optics, achieve superior signal to noise ratio, resolution, and inspection speed performance.

Method for optimizing inspection speed in low, and fluorescent light applications without sacrificing signal to noise ratio, resolution, or focus quality

A novel method all of and apparatus for categorizing different material regions of an object-to-be inspected, by optical scanning of the object to produce a pixel image thereof, discriminating different pixel regions of the image corresponding to possibly different materials on the basis of color, and texture brightness measurements of the pixel regions and assigning preliminary likelihoods to such discrimination through with ambiguities; and comparing the measurements of the pixel regions with their local neighborhood surroundings in the image to assist in resolving said ambiguities and determining the material categorizations of the pixel regions with a high likelihood.

Method of and apparatus for optical imaging inspection of multi-material objects and the like

A novel wafer or circuit board automatic scanning optical inspection system and technique using the reference comparison principle for finding defects in scanned sample images, that enables a new degree of universality in finding all defects including very small single pixel conductor breaks and shorts and defects of irregular shapes, and together with simultaneous design rule processing, through the use of processed skeletal reference images and with separately programmable alignment tolerance and detection parameters.

APPARATUS FOR AND METHOD OF AUTOMATIC OPTICAL INSPECTION OF ELECTRONIC CIRCUIT BOARDS, WAFERS AND THE LIKE FOR DEFECTS, USING SKELETAL REFERENCE INSPECTION AND SEPARATELY PROGRAMMABLE ALIGNMENT TOLERANCE AND DETECTION PARAMETERS

Growing community of inventors

Pembroke, MA, United States of America

Robert P Bishop