Keysight Technologies, Inc.

Robert M Neff

Nathaniel Guilar

Paul Lewis Corredoura

John Patrick Keane

A device for generating a sampling strobe, which controls a sampling device to sample an input signal, includes a phase shifter configured to phase shift an input clock to provide multiple phase shifted input clock signals; and aperture generating circuits configured to generate sampling clock signals from the phase shifted input clock signals, respectively, by adjusting duty cycles of the phase shifted input clock signals to provide sampling pulses having desired pulse widths, where for each sampling clock signal of the sampling clock signals, a rising edge and a falling edge of each sampling pulse originate from the same input edge of the input clock; and apply the sampling clock signals to interleaved samplers of the sampling device, respectively, for controlling sampling of the input signal by integrating according to the desired pulse widths of the sampling pulses, where the desired pulse widths correspond to sampling apertures.

System and method for generating sampling strobe for sampling an input signal

A system for measuring voltage includes a pulse-width modulator or voltage controlled oscillator (VCO) configured to receive an input voltage waveform from a DUT, and to output a pulse-width modulated (PWM) signal or frequency modulated (FM) signal mapped to the input voltage waveform, respectively; an optical transmitter configured to be modulated by the PWM signal or the FM signal to output an optical pulse signal having pulse widths corresponding to pulse widths of the PWM signal or equal to the frequency of the FM signal, respectively; an optical receiver configured to receive the optical pulse signal over an optical link and to convert the optical pulse signal to an electrical current; a transimpedance amplifier (TIA) configured to convert the electrical current to a voltage signal; and at least one filter or detection circuit configured to recover the input voltage waveform or provide numeric values corresponding to the input voltage waveform.

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Palo Alto, CA, United States of America

Robert M Neff