Stmicroelectronics Gmbh

Robert M Mills

Robert G Warren

An integrated circuit including functional circuitry; test circuitry connected to the functional circuitry, wherein the test circuitry is arranged to control the testing of the functional circuitry; and clock signal generating circuitry connected to both the functional circuitry and the test circuitry. The test circuitry is arranged to use the clock signal for testing the functional circuitry.

Method and apparatus for testing a functional circuit at speed

An integrated circuit including test circuitry, the test circuitry including a counter for counting clock signals and having an output for providing a control signal. The counter being arranged to have an internal state, and the counter being arranged to change the control signal on the internal state of counter reaching a predetermined value.

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Bristol, United Kingdom

Robert M Mills