Agilent Technologies, Inc.

Robert Locascio

Jochen Rivoir

Joseph Michael Gorin

George Stennis Moore

Matthew Johnson

Peter J Cain

Moray Denham Rumney

John Francis McLaughlin

David H Molinari

Using component-level test data to reduce system test. By modeling a system, sensitivity analysis reveals critical components and parameters of those components required to meet system performance parameters. Critical components are tested for these parameters, and these measurements associated with the components. Systems may be assembled which are modeled to meet the system performance parameters based on the model and the measured parameters. Systems may be assembled and calibration coefficients derived and applied from the model and the measured parameters.

Using component-level calibration data to reduce system-level test

Growing community of inventors

Crystal Lake, IL, United States of America

Robert Locascio