General Lasertronics Corporation

Other

Optical Coating Laboratory, Inc.

Labintelligence, Inc.

Baradun R&d Ltd.

Robert L Cargill

James W Thomas

Mitchell R Wool

Ronny Bar-Gadda

Claudio Zanelli

Claudio I Zanelli

Basil L Swaby

Erich Gombocz

A laser-based method of removing a coating from a surface comprises directing a laser pulse to a first position on the surface, removing the coating from the first position by rapidly elevating a surface temperature of the first position using the laser pulse and thereby disassociating the coating from the surface and collecting the disassociated coating. In some embodiments, the coating comprises an environmentally harmful substance such as Hexavalent Chromium. In some embodiments, the coating comprises Diamond-Like Carbon (DLC), Vitrified Contaminant Material (CMAS). The disassociated coating is collected by a waste collector.

Laser ablation for the environmentally beneficial removal of surface coatings

A coating removal apparatus removes a coating from a surface. The apparatus has a movable scanning head and scanning optics. The scanning head is movable in one dimension, and the scanning optics adjust in two dimensions to compensate for movement of the scanning head to implement long range scanning with a uniform scanning pattern. Further, a surface roughness is determined by measuring specular and scattered reflections at various angles. For composite surfaces, the apparatus utilizes UV laser radiation and a controlled atmosphere to remove coating and alter the chemical characteristics at the surface.

Methods for stripping and modifying surfaces with laser-induced ablation

An apparatus for and method of calculating an integrated index of a transparent, translucent or opaque material for a desired wavelength range, the method comprising measuring a filtered value of the material as a function of wavelength within the desired wavelength range and calculating a protection index from the measured filtered value. The integrated index is used to quantify the ultraviolet, infra-red, erythemal or aphakic exposure properties of the material. In addition, the integrated index is used to quantify the photopic and/or scotopic response capabilities of the material. Further, the integrated index is used to quantify the differential or mean color indices of the material in comparison to the color spectrum or another material. Moreover, the integrated index is used to quantify the heat flux absorbed by the material.

Method and apparatus for quantifying an 'integrated index' of a material medium

In a magnetic disk medium, a substrate is etched to have a designed, controlled topography. A magnetic recording medium and a protective layer are provided over the substrate. A method for controlling production of the surface characteristics of the magnetic disk medium is controlled to optimize surface characteristics for use of the magnetic disk medium in a magnetic disk apparatus that reads information stored on the magnetic disk medium.

Magnetic disk medium with designed textured surfaces and controlled

A spectral wavelength discrimination system and method for using are provided which allows the wavelength of a beam of radiation to be accurately determined using compact inexpensive optics and electronics. The system is particularly useful for identifying the emission wavelength of a multi-component marker system which includes a plurality of components having different wavelength ranges. The system comprises a wavelength selective beamsplitter, termed a Linear Wavelength Filter, that directs predetermined fractions of the beam at each wavelength into each of two output beams. The intensities of these output beams are measured. The measurements and selected system parameters, including the beamsplitter spectral characteristics and the detector sensitivity characteristics are used in a special algorithm for performing Fourier based wavelength-dispersive analysis. The unique solution of the Fourier based analysis is the wavelength of the beam of radiation. The system employs various optical components and structures to achieve the desired spatial resolution and sensitivity. Multiple channel devices and other special configurations are also described.

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San Jose, CA, United States of America

Robert L Cargill