Leland Stanford Junior University

The United States of America As Represented by the Administrator of the

Sri International

Inter-university Research Institute Corporation Research Organization of Information and Systems

Quanta-ray, Inc.

Robert L Byer

Martin M Fejer

Gregory David Miller

Lawrence E Myers

Tso Y Fan

Santanu Basu

Thomas James Kane

Eric J Lim

Ke-Xun Sun

Robert G Batchko

Herbert J Shaw

Shoichi Sudo

Konstantin L Vodopyanov

Richard L Herbst

Alireza Marandi

Michael Digonnet

Celestino Gaeta

William J Kozlovsky

Gregory A Magel

Leslie A Gordon

Michel J F Digonnet

Yoshihisa Yamamoto

Supriyo Sinha

Jens Limpert

Amado Cordova

Keith Edward Bennett

Jeffrey A Paul

Shailendhar Saraf

Tomas Plettner

Shoko Utsunomiya

Anthony J Alfrey

Jan E Van Der Laan

Alan C Nilsson

C David Nabors

John L Nightingale

John M Eggleston

Robert C Eckardt

Brett A Allard

Saps Buchman

Cordova Amado

Zhe Wang

Graham S Allen

Charles D Nabors

Arun Kumar Sridharan

Andreas Sizmann

Stephan Schiller

Vladimir Shur

Robert J Shine, Jr

Uwe Kurt Bader

Jan-Peter Meyn

Arne Rosengreen

Edward R Murray

George J Dixon

William Tulloch

Todd Rutherford

Samuel T Wong

Justin D Mansell

In one aspect, a computational machine includes an optical device configured to receive energy from an optical energy source and generate a number Nof optical signals, and a number Nof coupling devices, each of which controllably couples a plurality of the number Noptical signals. The coupling devices are individually controlled to simulate a computational problem. In another aspect, a computational machine includes a number Nof parametric oscillators and a number Nof coupling devices, each of which controllably couples a plurality of the number Nof parametric oscillators together. The coupling devices are individually controlled to simulate a computational problem.

Computation using a network of optical parametric oscillators

A random number generator includes a light source emitting light at a first frequency, an optical unit including an optical component configured to receive light at the first frequency and emit light at a second frequency, and a measurement unit configured to receive light at the second frequency, and generate a random output value related to a phase parameter of the light at the second frequency.

Optical quantum random number generator

Certain embodiments relate to and involve producing broadband phase-locked frequency combs in the near-infrared and mid-infrared spectral ranges. One such embodiment is directed to a system, with a pump laser and an optical parametric oscillator (OPO) resonator, that is configured to produce broad-bandwidth frequency combs in the near-infrared and mid-infrared frequency ranges. The pump laser is configured to produce femtosecond pulses of light having a pulse repetition rate. The optical parametric oscillator (OPO) resonator that is coupled to the pump laser for facilitating synchronous OPO pumping by matching a roundtrip time of the pulses of light within the OPO resonator with the pulse repetition rate of the pump laser. Among other more specific aspects, the OPO resonator can include a nonlinear optical gain element to provide broad-bandwidth parametric amplification, and optical elements to direct the pulses of light from the femtosecond laser to the nonlinear gain element and to direct subharmonic frequencies of the light out of the optical cavity.

Infrared frequency comb methods, arrangements and applications

Systems, methods, devices and apparatus are implemented for producing controllable charged particle beams. In one implementation, an apparatus provides a deflection force to a charged particle beam. A source produces an electromagnetic wave. A structure, that is substantially transparent to the electromagnetic wave, includes a physical structure having a repeating pattern with a period L and a tilted angle &#x3b1;, relative to a direction of travel of the charged particle beam, the pattern affects the force of the electromagnetic wave upon the charged particle beam. A direction device introduces the electromagnetic wave to the structure to provide a phase-synchronous deflection force to the charged particle beam.

Laser-driven deflection arrangements and methods involving charged particle beams

Charge transfer is provided to or from an electrically isolated test body by AC modulation of the photoelectric effect. More specifically, a reference body is disposed near the test body without physical contact between the reference and test bodies. Facing surfaces of the reference and test bodies are illuminated by optical radiation having a sufficiently short wavelength that charged particles are emitted from the reference and test bodies. An electrical bias is established between the reference body and the test body. Both the optical radiation and the electrical bias are modulated at the same frequency. A magnitude and direction of a charge transfer rate between the reference and test bodies is set by selecting a phase relation between the optical radiation and the electrical bias.

Charge management of electrically isolated objects via modulated photoelectric charge transfer

An angular magnification effect of diffraction is exploited to provide improved sensing and scanning. This effect is most pronounced for a normal or near-normal incidence angle in combination with a grazing diffraction angle, so such configurations are preferred. Angular sensitivity can be further enhanced because the width of the diffracted beam can be substantially less than the width of the incident beam. Normal incidence configurations with two symmetric diffracted beams are preferred, since rotation and vertical displacement can be readily distinguished. Increased sensitivity to vertical displacement can be provided by incorporating an interferometer into the measurement system. Quad cell detectors can be employed to provide sensitivity to rotation about the grating surface normal. A 2-D grating can be employed to provide sensitivity to angular displacements in two different planes (e.g., pitch and yaw). Combined systems can provide sensitivity to vertical displacement and to all three angular degrees of freedom.

Grating angle magnification enhanced angular sensor and scanner

Photodarkening in active fiber or waveguide devices (e.g. lasers, amplifiers, and incoherent sources such as ASE sources) can be reduced by altering the dopant concentration along the length of the doped fiber. A fiber or waveguide device includes two or more intentionally doped fiber or waveguide sections having different concentrations of one or more dopants. The dopants provide optical gain responsive to pump radiation provided to the fiber device by a pump source. A first optical intensity in a first of the fiber or waveguide sections is greater than a second optical intensity in a second of the fiber or waveguide sections. A first dopant concentration in the first fiber or waveguide section is lower than a second dopant concentration in the second fiber or waveguide section. Thus the dopant concentration is reduced in sections of the fiber or waveguide device having a higher optical intensity. The optical intensity can be due to pump radiation and/or signal radiation. Reduced dopant concentration in regions of high optical intensity reduces photodarkening.

Mitigation of photodarkening to achieve laser oscillation and amplification with highly doped fibers

Measurement of a distance change between a reference surface and a target is provided. A substrate has a first surface facing the target and including a grating. The grating and target combine to form an optical interferometer responsive to changes in distance between the grating and the target. A second surface of the substrate coincides with the reference surface and faces away from the target. Thickness information pertaining to the substrate is combined with results from the optical interferometer to provide a measurement of distance change between reference surface and target. The substrate is preferably a rigid material having picometer level dimensional stability.

High precision interferometer apparatus employing a grating beamsplitter

A method for batch manufacturing of slabs for zig-zag lasers including steps of bonding two non-active media to either side of an active medium to form a sandwich, dicing the sandwich to provide slices, rendering two surfaces of each slice into total-internal-reflection (TIR) surfaces, and then dicing the slices perpendicular to the TIR surfaces to provide a plurality of zig-zag slabs.

Method for fabricating zig-zag slabs for solid state lasers

A method for fabricating periodically poled structures. The method produces an electric field within a ferroelectric substrate by applying a voltage waveform to an electrode structure disposed on a surface of the substrate. The waveform raises the electric field magnitude to a level substantially greater than that required to reverse domains within the substrate. The waveform then lowers the voltage such that the electric field has a value at which a domain wall velocity is most sensitive to changes in the field. The waveform maintains the electric field value until a current through the substrate drops substantially. The electric field is then lowered to a value below a level required to sustain domain wall motion, but greater than a level below which backswitching occurs. The electric field is then lowered to zero in such a way as to prevent backswitching. Alternatively, the electric field is maintained for a time t determined by t&equals;x/v, where x is a domain wall half-width and v is a domain wall velocity. Subsequently, the waveforms lower the voltage to zero.

Method for fabricating efficient sources of electromagnetic radiation

A method for fabricating periodically poled structures. The method produces an electric field within a ferroelectric substrate by applying a voltage waveform to an electrode structure disposed on a surface of the substrate. The waveform raises the electric field magnitude to a level substantially greater than that required to reverse domains within the substrate. Domain reversal continues through to completion at which time the poling field is turned off or substantially reduced to induce spontaneous backswitch poling. The forward poling field is then reapplied to stop the backswitch poling. The ability to selectively enable and terminate backswitching allows for the formation of domain patterns with small feature sizes and high uniformity through large volumes of material.

Backswitch poling method for domain patterning of ferroelectric materials

An apparatus for generating three or more optical signals. The apparatus generally comprises a coherent source, an optical parametric generation device and a sum frequency generator. The coherent source generates a first optical signal having a first free-space wavelength. The optical parametric generation device interacts the first optical signal to produce an idler signal and a second optical signal having a second free-space wavelength while transmitting a portion of the first optical signal to the sum frequency generator. The sum frequency generator non-linearly combines part of the second portion of the first optical signal with the idler signal to produce a third optical signal characterized by a third free-space wavelength. The first, second, and third optical signals may comprise collinear red green and blue beams that may be modulated and scanned to produce an image. Furthermore, the optical parametric generation device and the sum frequency generator may be fabricated as a single monolithic device.

Laser light source and image display based on quasi-phasematched nonlinear optical devices

A method of patterning domains within a body of a ferroelectric material includes the application of an electric field thereto via spaced conductors. Prior to applying the electric field to the material effects on the patterning of the existence of fringe electric field components which will be created in said body by said application of an electric field, surface treatments, and relative geometries of the body and the conductors are examined. The steps of this examination include:

Electric field domain patterning

A light amplification device comprises a laser slab and optics for establishing an optical beam at the lasing wavelength. The beam travels inside the slab in a zig-zag path between two reflecting faces. The slab is also cooled through the reflecting faces. The slab is pumped through one or more pumping faces, each pumping face being distinct from the reflecting faces. Light from the pump is incident upon the slab in a direction that is transverse to the plane of propagation of the lasing wavelength beam. This arrangement separates the cooling interfaces from the pumping interfaces. Distortions in the beam due to thermal effects are largely averaged out by the zig-zag path. The device may function as either a laser or an optical amplifier.

Transverse-pumped sLAB laser/amplifier

A high reflectance deformable mirror includes first and second substrates. The first substrate has formed therein a membrane having a bottom surface and a polished top surface. The top surface of the membrane forms the mirror surface and is preferably covered with a high reflectance coating. The first substrate also has formed therein at least one pillar for deforming the membrane. The pillar is integrally formed with the membrane and extends from the bottom surface of the membrane. The second substrate has at least one actuating member positioned thereon for actuating the pillar. Further, the first substrate is mounted to the second substrate such that the bottom surface of the membrane faces the second substrate. In a preferred embodiment, the actuating member comprises an electrode for applying an electrostatic force to the pillar. Also disclosed are single substrate embodiments of the mirror and preferred methods for producing the mirror.

Micromachined high reflectance deformable mirror

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Stanford, CA, United States of America

Robert L Byer