Varian Australia Pty Ltd

Agilent Technologies Australia (m) Pty Ltd

Robert John Francis

Michael Ron Hammer

An apparatus for measuring specular reflectance of a sample is provided including a light source for transmitting a beam of light at an angle of incidence onto a surface of a sample; a polarizing filter comprising a wire grid that avoids a need for collimation of the incident beam of light; a sample holder for mounting the sample; and a detector assembly for detecting a beam of light which is specularly reflected from a surface of the sample; wherein the sample holder and detector assembly are mounted for relative movement, such that the light source, the detector assembly and the sample holder are relatively positionable for a specularly reflected component of a transmitted light beam to be detected for different angles of incidence of the light beam.

Apparatus for absolute variable angle specular reflectance measurements

Apparatus () for measuring absolute specular reflectance of a surface of a sample () includes a sample holder (), a light source () for transmitting an incident light beam () onto a surface of the sample () and a detector () for detecting a specularly reflected component of the incident light. The light source (), sample holder () and detector () are mounted and operatively associate () to be relatively moveable to vary the angle of incidence of light () onto sample () and to correspondingly automatically vary the relative position of the detector () such that the angle of reflection equals the angle of incidence. In the absence of the sample () or upon removal of the sample holder (), light () impinges directly onto detector () to directly allow measurement of the absolute intensity of the light beam () as a reference measurement. This avoids the need to use intervening optical components such as mirrors which may degrade over time. It also allows provision of a relatively simplified apparatus.

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Glen Waverley, Australia

Robert John Francis