Microsoft Technology Licensing, LLC

Robert James Ray

Garrett Douglas Blankenburg

William Paul Hovis

Peter Anthony Atkinson

Brian K Langendorf

Andres Felipe Hernandez Mojica

Erng-Sing Wee

Samy Boshra-Riad

Andres Felipe Hernandez

Brian Keith Langendorf

An example method for adjusting operation of an integrated circuit includes testing a plurality of electronic elements of the integrated circuit including one or more redundant electronic elements designated as inactive according to a manufacturer's default configuration of the integrated circuit to determine one or more operating parameters of the integrated circuit. The method further includes selecting a subset of electronic elements from the plurality of electronic elements based on the one or more operating parameters, wherein the subset of electronic elements is designated as active according to an updated configuration of the integrated circuit, and controlling operation of the integrated circuit using the updated configuration instead of the manufacturer's default configuration.

Integrated circuit operation adjustment using redundant elements

Power reduction and voltage adjustment techniques for computing systems and processing devices are presented herein. In one example, a method includes executing a voltage characterization service for a processing device of a computing apparatus to determine at least one supply voltage for the processing device, the voltage characterization service comprising a functional test that exercises the processing device at iteratively adjusted voltages in context with associated system elements of the computing apparatus. During execution of the voltage characterization service, the method includes monitoring for operational failures of at least the processing device, and responsive to the operational failures, determining at least one resultant supply voltage.

Processor device supply voltage characterization

Voltage adjustment techniques for computing systems and processing devices are presented herein. In one example, a method of determining operating voltages for a processing device includes executing a voltage adjustment process to determine at least one input voltage for the processing device lower than a manufacturer specified operating voltage. During the voltage adjustment process, the method includes applying incrementally adjusted input voltages to the processing device, operating the processing device according to a functional test that exercises the processing device in context with associated system elements of a computing assembly, and monitoring for operational failures of at least the processing device during application of each of the incrementally adjusted input voltages. Responsive to the operational failures, the method includes determining corresponding values of the incrementally adjusted input voltages and establishing an input voltage based at least in part on the corresponding values of the incrementally adjusted input voltages.

Input voltage reduction for processing devices

Thermal reduction and voltage adjustment techniques for computing systems and processing devices are presented herein. In a first example, a method of operating a voltage control system for a processing device includes operating the processing device in a computing assembly at a selected performance level, the processing device supplied with at least one input voltage at a first voltage level. The method includes monitoring thermal information associated with the computing assembly, and when the thermal information indicates a temperature associated with the computing assembly exceeds a threshold temperature, adjusting the at least one input voltage level supplied to the processing device to a second voltage level lower than the first voltage level and continuing to operate the processing device at the selected performance level.

Voltage based thermal control of processing device

Power reduction and voltage adjustment techniques for computing systems and processing devices are presented herein. In one example, a method includes receiving a voltage characterization service over a communication interface of the computing apparatus as transferred by a deployment platform remote from the computing apparatus. The method includes executing the voltage characterization service for a processing device of the computing apparatus to determine at least one input voltage for the processing device lower than a manufacturer specified operating voltage, the voltage characterization service comprising a functional test that exercises the processing device at iteratively adjusted voltages in context with associated system elements of the computing apparatus. During execution of the voltage characterization service, the method includes monitoring for operational failures of at least the processing device, and responsive to the operational failures, restarting the processing device using a recovery voltage higher than a current value of the iteratively adjusted voltages.

Processor device voltage characterization

Secure voltage adjustment techniques for computing systems and processing devices are presented herein. In one example, a method of controlling operating voltages for a processing device includes initializing a security portion of the processing device after application of input voltages to the processing device as supplied by voltage regulation circuitry according to voltage identifiers (VIDs) established for the processing device. The method includes, in the security portion, generating adjusted input voltages based on at least the VIDs and authenticated voltage offset information stored according to a digitally signed security process, and instructing the voltage regulation circuitry to supply the adjusted input voltages to the processing device.

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Snoqualmie, WA, United States of America

Robert James Ray